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Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens

Published online by Cambridge University Press:  26 July 2009

B Van Leer ,
LA Giannuzzi  and
Y-C Wang
B Van Leer
Affiliation:
FEI Company
LA Giannuzzi
Affiliation:
FEI Company
Y-C Wang
Affiliation:
FEI Company

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 336 - 337
Copyright
Copyright © Microscopy Society of America 2009