Advances in S/TEM Sample Preparation Using a FIB-SEM: Techniques for the Ultimate Sample

B. Van Leer; D. Wall

doi:10.1017/S1431927613006338

Advances in S/TEM Sample Preparation Using a FIB-SEM: Techniques for the Ultimate Sample

Published online by Cambridge University Press: 09 October 2013

B. Van Leer and

D. Wall

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B. Van Leer: Affiliation:
D. Wall: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 868 - 869

DOI: https://doi.org/10.1017/S1431927613006338 [Opens in a new window]

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Advances in S/TEM Sample Preparation Using a FIB-SEM: Techniques for the Ultimate Sample

Abstract

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