Microscopy and Microanalysis: Volume 27 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - August 2021

Analytical Sciences Symposia

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Developing near-atomic-scale chemical analysis in liquid-phase S/TEM to study high capacity battery anodes

Beam-induced heating at low electron fluxes during liquid phase transmission electron microscopy

In-situ Liquid Electrochemical TEM Investigation of Semi Solid-State LMNO Micro-Battery

The effect of interfaces in liquid phase electron microscopy from an empirical viewpoint

Advances in Analytical STEM-in-SEM

STEM-in-SEM: A Re-Emerging Material Measurement Approach

Combining in situ heating with transmission diffraction and imaging in SEM for investigation of early stages of solid-state dewetting

Analysis of superconducting thin films in a modern FIB/SEM dual-beam instrument

STEM-tomography in SEM

NanoMi Open Source (S)TEM Platform: Initial SEM Implementation

Vendor Symposium

5D-STEM: Live processing and display at 15,000 diffraction patterns per second

Spectra optimizes the use of electron dose

A New Spectroscopic Imager for X-rays from 0.5 keV to 150 keV Combining a Fully Depleted pnCCD Coupled to a Columnar CsI(Tl) Scintillator with Fano Limited Energy Resolution and Deep Subpixel Spatial Resolution

Strategies for Multimodal Analysis of Joint EELS and EDS Data

EELS Workshop: a Real-World Application of the Enabler Framework

Developments in sample preparation of advanced semiconductor devices from the bulk to nanometer-length scales

Data Management, Version Control, and Multiformat Analysis in Electron Microscopy

Challenges and opportunities for data management and collaborative analysis in shared electron microscopy facilities

Centralizing digital resources for data management, processing, and analysis for enterprise scale imaging research

Probelab ReImager: A Multi-Platform, Open Source Software for Electron Image and X-ray Map Visualization and Customization

Towards the Development of a Multi-Modal Community-Based AM Database

The evolution of an open source file format: a version control story

Microscopy and Microanalysis

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Volume 27 - August 2021

Analytical Sciences Symposia

New Frontiers in In-Situ Electron Microscopy in Liquids and Gases (L&G EM FIG Sponsored)

Advances in Analytical STEM-in-SEM

Vendor Symposium

Data Management, Version Control, and Multiformat Analysis in Electron Microscopy