Hostname: page-component-77c89778f8-5wvtr Total loading time: 0 Render date: 2024-07-18T18:00:43.651Z Has data issue: false hasContentIssue false
  • English
  • Français

Analysis of superconducting thin films in a modern FIB/SEM dual-beam instrument

Published online by Cambridge University Press:  30 July 2021

Lukas Grünewald ,
Daniel Nerz ,
Marco Langer ,
Sven Meyer ,
Nico Beisig ,
Pablo Cayado ,
Ruslan Popov ,
Jens Hänisch ,
Bernhard Holzapfel  and
Dagmar Gerthsen
Lukas Grünewald
Affiliation:
Karlsruhe Institute of Technology (KIT), Laboratory for Electron Microscopy (LEM), Engesserstraße 7, 76131 Karlsruhe, Germany, United States
Daniel Nerz
Affiliation:
Karlsruhe Institute of Technology (KIT), Laboratory for Electron Microscopy (LEM), Engesserstraße 7, 76131 Karlsruhe, Germany, United States
Marco Langer
Affiliation:
Karlsruhe Institute of Technology (KIT), Institute for Technical Physics (ITEP), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, United States
Sven Meyer
Affiliation:
Karlsruhe Institute of Technology (KIT), Institute for Technical Physics (ITEP), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, United States
Nico Beisig
Affiliation:
Karlsruhe Institute of Technology (KIT), Institute for Technical Physics (ITEP), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, United States
Pablo Cayado
Affiliation:
Karlsruhe Institute of Technology (KIT), Institute for Technical Physics (ITEP), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, United States
Ruslan Popov
Affiliation:
Karlsruhe Institute of Technology (KIT), Institute for Technical Physics (ITEP), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, United States
Jens Hänisch
Affiliation:
Karlsruhe Institute of Technology (KIT), Institute for Technical Physics (ITEP), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, United States
Bernhard Holzapfel
Affiliation:
Karlsruhe Institute of Technology (KIT), Institute for Technical Physics (ITEP), Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany, United States
Dagmar Gerthsen
Affiliation:
Laboratorium für Elektronenmikroskopie, Karlsruher Institut für Technologie (KIT), Engesserstr. 7, 76131 Karlsruhe, Germany, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Analytical STEM-in-SEM
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1056 - 1058
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Jha, A.K., Matsumoto, K., Front. Phys. 7 (2019) 82.CrossRefGoogle Scholar
Feighan, J.P.F., et al. , Supercond. Sci. Technol. 30 (2017) 123001.CrossRefGoogle Scholar
Sun, C., et al. , J. Mater. Sci. 55 (2020) 13824–13835.CrossRefGoogle Scholar
Potapov, P., Ultramicroscopy 160 (2016) 197–212.Google Scholar
Grünewald, L., et al. , Supercond. Sci. Technol. 34 (2021) 035005.Google Scholar
Guzman, R., et al. , Phys. Rev. Mater. 1 (2017) 24801.CrossRefGoogle Scholar