Microscopy and Microanalysis: Volume 27 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Developing cryogenic and vacuum transfer capabilities at the Australian Centre for Microscopy and Microanalysis

Nanoscale Chemical Imaging in Zeolite Catalysts by Atom Probe Tomography

In Situ Atom Probe Tomography Study of The Influence of Deformation on Early Stages of Oxidation of Fe18Cr10Ni Alloy

The effect of laser energy on the measurement of oxide stoichiometry of Co2FeO4 nanoparticles by atom probe tomography

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Wide Dynamic Range, 10 kHz Framing Detector for 4D-STEM

High-Fidelity 4D-STEM Enabled by Live Processing at 15’000 Detector Frames Per Second

Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI

Leveraging Hybrid Pixel Electron Detection Technology to Expand Electron Microscopy Observation of Material Structures at low Voltages

An Ultrafast Direct Electron Camera for 4D STEM

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Multimodal characterisation on FIB instruments combining nano-scale SIMS and SE imaging

Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries

Is the Helium Ion Microscope (Ne) suitable for EBSD sample preparation?

Nanocrystalline Diamond Grids for FIB Specimen Preparation and S/TEM Analytics

In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB

The virtual FIB: Simulating 3D in situ lift-out for visualization and technique development

Microscopy and Microanalysis for Real World Problem Solving

Use of Full-Field X- ray Imaging and Ptychographic X-ray Computed Tomography for the Investigation of 3D Morphology of Micro-Nano Silver Materials for Advanced Electronics Packaging Applications

Micro Computed Tomography Analysis of Four-Way Conversion Catalysts using Artificial Intelligence-Enabled Image Processing

Multi-Energy X-Ray Computed Tomography for Source Rock Characterization

Metal Foams: Linking Dynamic CT Results to Simulation and Modeling

Dynamic X-ray micro-CT insights of the recovery of ore bodies in presence of clay

Microscopy and Microanalysis

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Volume 27 - August 2021

Physical Sciences Symposia

Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis

Analytical Sciences Symposia

Diffraction Imaging Across Disciplines

Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences

Microscopy and Microanalysis for Real World Problem Solving