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The virtual FIB: Simulating 3D in situ lift-out for visualization and technique development

Published online by Cambridge University Press:  30 July 2021

Aleksander Mosberg
Aleksander Mosberg*
Affiliation:
SuperSTEM, Daresbury, England, United Kingdom

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1022 - 1024
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Giannuzzi, L A, Stevie, F A (eds.), “Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques, and Practice” (Springer, New York).Google Scholar
Schaffer, M, Schaffer, B and Ramasse, Q, Ultramicroscopy. 114 (2012), 62–71.CrossRefGoogle Scholar
Li, C et al. , Ultramicroscopy 184 (2018), 310–317.CrossRefGoogle Scholar
Mosberg, A B et al. , Appl. Phys. Lett. 115 (2019), 122901.Google Scholar
Echlin, M P et al. , Rev. Sci. Instrum. 83 (2012), 023701CrossRefGoogle Scholar
Sato, T et al. , J. Phys. Conf. Ser. 902 (2017), 012019Google Scholar
About Blender, https://www.blender.org/about/Google Scholar
The Norwegian University of Science and Technology and NorFab are acknowledged for support through the Enabling technologies: NTNU Nano program. SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar