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Nanocrystalline Diamond Grids for FIB Specimen Preparation and S/TEM Analytics

Published online by Cambridge University Press:  30 July 2021

Lucille Giannuzzi
Affiliation:
EXpressLO LLC, Lehigh Acres, Florida, United States
Nicolaie Moldovan
Affiliation:
Alcorix Co., Plainfield, Illinois, United States
Jamie Trindell
Affiliation:
Sandia National Lab, Pleasanton, California, United States
Joshua Sugar
Affiliation:
Sandia National Laboratories, Livermore, California, United States

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Giannuzzi, L.A., et al. , Microsc. Microanal., 21 (2015) p. 1034.Google Scholar
The NCD grid design and methods for EXLO are covered under US Patents 8,740,209; 8,789,826; 10,522,324; 10,801,926.Google Scholar