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In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
- Information
- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America