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Volume 16 - July 2010

Contents

Page 27 of 57

Instrumentation and Techniques Symposia

Image Analysis & Quantitative Microscopy

Abstract

  • Improving angular resolution of the crystal orientation determined with spot diffraction patterns

  • E Rauch, M Véron
  • Published online by Cambridge University Press:
    01 August 2010, pp. 770-771
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Failure Analysis: Practical Microscopy, Metallography and Fractography from Real World Applications or Research Case Studies

Abstract

  • Mineshaft Roller Bearing Failure Analysis

  • RJ Parrington, DM Christie
  • Published online by Cambridge University Press:
    01 August 2010, pp. 772-773
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Revealing Prior-Austenite Grain Boundaries

  • GF Vander Voort
  • Published online by Cambridge University Press:
    01 August 2010, pp. 774-775
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Hydrogen Effects on the Failure Mechanisms in Fe-Ni Weldments

  • JA Fenske, IM Robertson, R Ayer, M Hukle, D Lillig, B Newbury
  • Published online by Cambridge University Press:
    01 August 2010, pp. 776-777
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Multi-scale Investigation of the Hydrogen-Assisted Failure of X65 Pipeline Steel

  • M Martin, IM Robertson, B Somerday, C San Marchi, P Sofronis
  • Published online by Cambridge University Press:
    01 August 2010, pp. 778-779
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Analysis of a Spiral/Spliced Pipe Weld Hydrostatic Test Rupture

  • JL McDougall, FE Schmidt, Jr, ME Stevenson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 780-781
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Refraction-Assisted Illumination for Infrared Imaging of Integrated Circuits

  • S LaLumondiere, T Yeoh
  • Published online by Cambridge University Press:
    01 August 2010, pp. 782-783
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Correlative Light and Electron Microscopy (CLEM) for Characterization of Lithium Ion Battery Materials

  • C Thomas, M Edelmann, D Lysenkov, C Hafner, T Bernthaler, G Schneider
  • Published online by Cambridge University Press:
    01 August 2010, pp. 784-785
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Role of Microscopy and Microanalysis in Friction Stir Weld Development

  • M Fischer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 786-787
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Stress Corrosion Behavior of an Aluminum-Lithium Alloy

  • AA Frefer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 788-789
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Special Approaches to Metallography for Zirconium & Other Reactive Metals

  • SD Sparkowich
  • Published online by Cambridge University Press:
    01 August 2010, pp. 790-791
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Tin Whiskers: Electron Microscopy and EBSD Characterization

  • DF Susan, JR Michael, RP Grant, WG Yelton
  • Published online by Cambridge University Press:
    01 August 2010, pp. 792-793
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Electron Beam Induced Current Characterization of Dark Line Defects in Failed and Degraded High Power Quantum Well Laser Diodes

  • M Mason, N Presser, Y Sin, B Foran, SC Moss
  • Published online by Cambridge University Press:
    01 August 2010, pp. 794-795
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Corrosion Damage of Copper Tubes

  • M Panzenböck
  • Published online by Cambridge University Press:
    01 August 2010, pp. 796-797
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Role of Microscopy in Advanced Semiconductor Failure Analysis

  • XT Tong, L Pan, B Miner, K Johnson, S Subramaniam, M Sacks
  • Published online by Cambridge University Press:
    01 August 2010, pp. 798-799
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Scanning Cathodoluminescence Microscopy and Spectroscopy: New Developments and Applications

Abstract

  • Cathodoluminescence Study of Actinide Oxides

  • A Neuman, C Davis, T Nothwang, W Duncan, F Hampel, S Wilson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 802-803
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • An X-Ray and Cathodoluminescence Study of Cassiterite (SnO2)

  • S Wight, E Vicenzi, D Meier, K Benkstein
  • Published online by Cambridge University Press:
    01 August 2010, pp. 804-805
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Analyses of Semiconductor Materials by Spectrometric Full-color Cathodoluminescence Microscopy

  • H Saijo, Y Suzuki, M Shiojiri
  • Published online by Cambridge University Press:
    01 August 2010, pp. 806-807
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 27 of 57