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Volume 16 - July 2010

Contents

Page 26 of 57

Instrumentation and Techniques Symposia

Image Analysis & Quantitative Microscopy

Abstract

  • Advanced Spectral Imaging for Microanalysis of Cultural Heritage

  • FG France, MB Toth, WA Christens-Barry, K Boydston
  • Published online by Cambridge University Press:
    01 August 2010, pp. 728-729
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Elastic Alignment of Microscopic Images Using Parallel Processing on CUDA-Supported Graphics Processor Units

  • J Michálek, M Čapek, J Janáček, L Kubínová
  • Published online by Cambridge University Press:
    01 August 2010, pp. 730-731
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Applying the Google Earth™ Paradigm to Microscopical Specimen Mapping

  • NHM Caldwell, ARM Shoaib, BC Breton, DM Holburn
  • Published online by Cambridge University Press:
    01 August 2010, pp. 732-733
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Spatio-Temporal Simulation Environment: A Microscopy Image Based Modelization Framework

  • S Stoma, E Klipp
  • Published online by Cambridge University Press:
    01 August 2010, pp. 734-735
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Measurement of Capillary Length from 3D Images Acquired by Confocal Microscopy Using Image Analysis and Stereology

  • L Kubínová, J Janáček, I Eržen, XW Mao
  • Published online by Cambridge University Press:
    01 August 2010, pp. 736-737
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Automatic Detection of Combed DNA

  • S Hareli, E Ozeri-Galai, B Kerem, A Weiss
  • Published online by Cambridge University Press:
    01 August 2010, pp. 738-739
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Direct Comparison of Convergent Beam Electron Diffraction and Geometric Phase Analysis for Local Strain Measurement

  • D Diercks, G Lian, J Chung, M Kaufman
  • Published online by Cambridge University Press:
    01 August 2010, pp. 742-743
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Orientation Imaging Microscopy of Nanocrystalline Platinum Thin Film Using Transmission Electron Microscope

  • V Kumar
  • Published online by Cambridge University Press:
    01 August 2010, pp. 744-745
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • STEM Stacking Fault Analysis in Ni-based Super Alloys

  • PJ Phillips, M De Graef, MJ Mills
  • Published online by Cambridge University Press:
    01 August 2010, pp. 746-747
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantitative Phase Retrieval by Ptychography in TEM

  • F Hüe, AM Maiden, JM Rodenburg, PA Midgley
  • Published online by Cambridge University Press:
    01 August 2010, pp. 748-749
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Applications of Quantitative Microscopy in the Plastics Industry

  • O Guise, C Strom
  • Published online by Cambridge University Press:
    01 August 2010, pp. 750-751
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Effect of Tip-sample Angle on Atomic Force Microscopy Images

  • F Wang, F Zhou
  • Published online by Cambridge University Press:
    01 August 2010, pp. 752-753
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Advanced Simulation of Polycrystalline Electron Diffraction Patterns

  • XZ Li
  • Published online by Cambridge University Press:
    01 August 2010, pp. 754-755
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Lateral Brightness Correction in Confocal Microscopy Images Using Mathematical Morphology Filters

  • J Michálek, M Čapek, XW Mao, L Kubínová
  • Published online by Cambridge University Press:
    01 August 2010, pp. 758-759
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes

  • Y Kohno, N Shibata, H Sawada, SD Findlay, Y Kondo, Y Ikuhara
  • Published online by Cambridge University Press:
    01 August 2010, pp. 760-761
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Detecting and Correcting Instabilities in STEM Images

  • N Braidy, Y Le Bouar, S Lazar, C Ricolleau
  • Published online by Cambridge University Press:
    01 August 2010, pp. 762-763
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Hyperspectral Data Restoration in Synchrotron-based Infrared Microspectroscopic Imaging

  • E Mattson, M Nasse, CJ Hirschmugl
  • Published online by Cambridge University Press:
    01 August 2010, pp. 764-765
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Defining HRTEM Resolution: Image Resolutions and Microscope Limits

  • MA O'Keefe, LF Allard, Jr, DA Blom
  • Published online by Cambridge University Press:
    01 August 2010, pp. 766-767
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 26 of 57