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Volume 16 - July 2010

Contents

Page 25 of 57

Instrumentation and Techniques Symposia

Specimen Preparation for SEM and EBSD

Abstract

  • Chromium Segregation at the Grain Boundaries in Ni-Fe-Cr Alloys

  • LV Saraf, AS Lea, CM Wang, A Dohnalkova, BW Arey
  • Published online by Cambridge University Press:
    01 August 2010, pp. 690-691
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Preparation of ‘Difficult’ Samples for EBSD

  • AP Sullivan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 694-695
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • EBSD Multiphase Preparation: U-10Mo, Zr, Al

  • C Necker, A Kelly
  • Published online by Cambridge University Press:
    01 August 2010, pp. 696-697
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • EBSD Pattern Quality and its Use in Evaluating Sample Surface Condition

  • SD Sitzman, G Nolze, MM Nowell
  • Published online by Cambridge University Press:
    01 August 2010, pp. 698-699
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Towards A More Quantitative Measurement of the Deformation During Metallographic Specimen Preparation Using EBSD and FIB

  • PT Pinard, P Hovington, M Lagacé, GF Vander Voort, R Gauvin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 700-701
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD)

  • B Saller, JR Porter, T Van Den Vlekkert, SD Walck
  • Published online by Cambridge University Press:
    01 August 2010, pp. 702-703
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Argon Ion Beam Alters Grain Structure of Copper in Surface Preparation for EBSD

  • RH Geiss, DT Read
  • Published online by Cambridge University Press:
    01 August 2010, pp. 704-705
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Sample Surface Preparation For Traditional EBSD Collection and 3D EBSD Collection

  • REA Williams, A Genc, D Huber, HL Fraser
  • Published online by Cambridge University Press:
    01 August 2010, pp. 706-707
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Application of Ion Cross Section Polishing: Comparison with Abrasive Polishing

  • B Ahn, SR Nutt
  • Published online by Cambridge University Press:
    01 August 2010, pp. 708-709
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • EBSD Investigation of Twinned Copper

  • RE Goddard, J Padelford, K Han, J Lu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 710-711
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • A Novel Method of Resin-Embedding Thin, Flexible Polymer Films for TEM Sectioning

  • K Ward, M Chun, C Queenan, A Calabro, J Morales, D Becker
  • Published online by Cambridge University Press:
    01 August 2010, pp. 712-713
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Image Analysis & Quantitative Microscopy

Abstract

  • Three-Dimensional Metallography for Visualization, Characterization, Modeling, and Simulation of Three-Dimensional Microstructures

  • AM Gokhale, H Singh, Y Mao, S Zhang, A Gurumurthy
  • Published online by Cambridge University Press:
    01 August 2010, pp. 714-715
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Image Analysis Characterization of Modern Pipe Steels Structures

  • AA Kazakov, DV Kiselev, EI Kazakova, LS Chigintsev
  • Published online by Cambridge University Press:
    01 August 2010, pp. 716-717
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Evaluation of the Shapes of Pores and Particles in Powder Metallurgy (PM) Materials Using Automated Image Analysis Techniques

  • TF Murphy
  • Published online by Cambridge University Press:
    01 August 2010, pp. 718-719
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Revealing the Microstructure of Super Alloys Using Lucas’ Reagent

  • GM Lucas
  • Published online by Cambridge University Press:
    01 August 2010, pp. 720-721
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Polishing Technique to Identify Particles in Polygranular Graphite

  • RM Paul, JE Morral
  • Published online by Cambridge University Press:
    01 August 2010, pp. 724-725
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Characterization of Dynamic Damage of Copper Targets using X-ray Micro Tomography

  • BM Patterson, EK Cerreta, D Dennis-Koller, CA Bronkhorst, BL Hansen
  • Published online by Cambridge University Press:
    01 August 2010, pp. 726-727
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 25 of 57