EBSD Pattern Quality and its Use in Evaluating Sample Surface Condition

SD Sitzman; G Nolze; MM Nowell

doi:10.1017/S143192761005467X

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Hasan, Noor Reifert, David Doring, Sebastian Schmidt, Stefan Tympel, Volker Schmidl, Frank Wolf, Thomas and Seidel, Paul 2016. Planar Hybrid Josephson Junctions Based on Ba-122 Single Crystals. IEEE Transactions on Applied Superconductivity, Vol. 26, Issue. 3, p. 1.

KURODA, Masatoshi KAMAYA, Masayuki YAMADA, Teruaki and AKITA, Koichi 2017. Detection of fatigue damage in stainless steel by EBSD analysis (Applicability of EBSD pattern quality). Transactions of the JSME (in Japanese), Vol. 83, Issue. 852, p. 17-00072.

Dietrich, D. Nolze, G. Del‐Solar‐Velarde, N. Nickel, D. Lampke, T. Chapoulie, R. and Castillo Butters, L. J. 2018. The Potential of EBSD and EDS for Ceramics Investigations—Case Studies on Sherds of Pre‐Columbian Pottery. Archaeometry, Vol. 60, Issue. 3, p. 489.

BAŞKUT, Sinem DÖLEKÇEKİÇ, Emrah GÜNKAYA, Göktuğ and KAVAS, Taner 2022. An EBSD Study on Crystallization of CaO-MgO-Al2O3-SiO2 (CMAS) Glass. Gazi Üniversitesi Fen Bilimleri Dergisi Part C: Tasarım ve Teknoloji, Vol. 10, Issue. 2, p. 216.

Yan, Yingrui Pan, Hongjiang Godfrey, Andy Jensen, Dorte Juul and Zhang, Xiaodan 2022. Stored energy calculation in AA 1050 based on deformation microstructure from electron backscatter diffraction data. IOP Conference Series: Materials Science and Engineering, Vol. 1249, Issue. 1, p. 012064.

Brodu, Etienne Winkelmann, Aimo and Seefeldt, Marc 2022. A Pattern Processing Method to Map Nanoscale Phases by EBSD. Microscopy and Microanalysis, Vol. 28, Issue. 3, p. 716.

Andrews, Caleb E. Strantza, Maria Calta, Nicholas P. Matthews, Manyalibo J. and Taheri, Mitra L. 2023. A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction. Ultramicroscopy, Vol. 253, Issue. , p. 113810.

Maleki, Erfan Bagherifard, Sara Rovatti, Ludovica Ishola, Rasheed Michael Revuru, Manoj and Guagliano, Mario 2023. Developing a best practice for sample preparation of additive manufactured AlSi10Mg for electron backscatter diffraction analysis. Additive Manufacturing Letters, Vol. 5, Issue. , p. 100122.

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EBSD Pattern Quality and its Use in Evaluating Sample Surface Condition

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