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EBSD Pattern Quality and its Use in Evaluating Sample Surface Condition

Published online by Cambridge University Press:  01 August 2010

SD Sitzman
Affiliation:
Oxford Instruments America
G Nolze
Affiliation:
Bruker AXS Microanalysis GmbH, Germany
MM Nowell
Affiliation:
EDAX-TSL

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010