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Volume 16 - July 2010

Contents

Page 30 of 57

Instrumentation and Techniques Symposia

Compositional X-ray Imaging

Abstract

  • Quantitative Soft X-ray Microscopy of Soft Matter

  • H Ade
  • Published online by Cambridge University Press:
    01 August 2010, pp. 888-889
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • X–Ray Imaging Spectroscopy Using an NTD Ge-Based Microcalorimeter: An Interdisciplinary Spin-Off from Astrophysics Research

  • E Silver, C Gilpin, E Vicenzi, T Lin, J Beeman, E Haller
  • Published online by Cambridge University Press:
    01 August 2010, pp. 890-891
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Event-Streamed Spectral Imaging in an Aberration-Corrected AEM: A Robust Approach to High Spatial Resolution XEDS Elemental Mapping

  • A Herzing, IM Anderson, M Anderson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 892-893
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Advances in Defocused-Beam Analysis and Compositional Mapping with the Electron-Probe Microanalyzer

  • P Carpenter, R Zeigler, B Jolliff
  • Published online by Cambridge University Press:
    01 August 2010, pp. 894-895
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Phosphorus and Other Impurities in Australian Iron Ores

  • CM MacRae, NC Wilson, M Pownceby, P Miller
  • Published online by Cambridge University Press:
    01 August 2010, pp. 896-897
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Hard X-ray Nanoprobe Characterization of Advanced Materials

  • V Rose, M Holt, R Winarski, J Maser
  • Published online by Cambridge University Press:
    01 August 2010, pp. 900-901
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Subsurface Analysis of Oil Paintings by Means of Scanning Macro-XRF

  • K Janssens, M Alfeld, J Dik, K Rickers
  • Published online by Cambridge University Press:
    01 August 2010, pp. 902-903
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Micro-Focus X-Ray Fluorescence (µ-XRF) as an Extension of the Analytical SEM

  • V-D Hodoroaba, V Rackwitz, D Reuter
  • Published online by Cambridge University Press:
    01 August 2010, pp. 904-905
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Multivariate Statistics in Microanalysis: From Abstract to Useful

  • JH Scott, J Davis
  • Published online by Cambridge University Press:
    01 August 2010, pp. 906-907
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Developing an X-ray Imaging Strategy

  • J Davis, JH Scott, N Ritchie
  • Published online by Cambridge University Press:
    01 August 2010, pp. 908-909
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging with Milli-XRF Benchtop Instrumentation

  • BE Scruggs, RW Anderhalt, LI Herczeg, A Lee
  • Published online by Cambridge University Press:
    01 August 2010, pp. 910-911
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Ultra-fast and Sensitive Element Distribution Measurement Using µ-XRF

  • M Haschke, U Rosseck, R Tagle, U Waldschläger, H Wagenknecht
  • Published online by Cambridge University Press:
    01 August 2010, pp. 912-913
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Comparison of SDD/WDS/Micro-XRF Element Mapping Methods Using a Garnet Schist Example

  • C Schwandt
  • Published online by Cambridge University Press:
    01 August 2010, pp. 914-915
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Post Processing of X-Ray Maps - Theoretical BSE Mapping, Totals Mapping and Ratio Mapping

  • K Moran, R Wuhrer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 916-917
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantitative Phase Analysis of Martian Meteorite Alteration

  • E Vicenzi, M Velbel
  • Published online by Cambridge University Press:
    01 August 2010, pp. 918-919
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Visualizing Low Contrast Compositional Microstructures with SDD-EDS X-ray Spectrum Imaging in the Scanning Electron Microscope

  • D Newbury
  • Published online by Cambridge University Press:
    01 August 2010, pp. 920-921
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Combined STEM/STXM Elemental Quantification for Cometary Particles

  • Z Gainsforth, A Butterworth, R Ogliore, A Westphal, T Tyliszczak
  • Published online by Cambridge University Press:
    01 August 2010, pp. 922-923
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Improving Sensitivity in Soft X-ray STXM Using Low Energy X-ray Fluorescence

  • AP Hitchcock, T Tyliszczak, M Obst, G Swerhone, J Lawrence
  • Published online by Cambridge University Press:
    01 August 2010, pp. 924-925
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 30 of 57