Microscopy and Microanalysis: Volume 16 -

FIB and TEM Studies of Diamond Films Prepared by Laser-Assisted Combustion Flame Deposition in Open Atmosphere
M Zhang, T McKindra, M O'Keefe
Published online by Cambridge University Press:

01 August 2010, pp. 208-209
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Fabrication and Model Simulation of the Ring-shaped Gate Carbon Nanotube Emitter Arrays
J Wu, J Jiao
Published online by Cambridge University Press:

01 August 2010, pp. 210-211
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Effectiveness of Environmental Control for the Ultrastructural Study of Buttery Materials Using Air Protection Holder and NB5000/HD-2700 System
T Sato, M Kudo, H Okushima, A Morikawa, Y Kuroda, T Onishi, T Agemura
Published online by Cambridge University Press:

01 August 2010, pp. 212-213
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

An Analysis of Li Ion Secondary Battery Materials by Using Focused Ion Beam Micro-sampling Technique and Cold Field Emission Scanning Transmission Electron Microscope
T Tanigaki, K Ito, K Nakamura, Y Nagakubo, J Azuma, T Kanemura
Published online by Cambridge University Press:

01 August 2010, pp. 214-215
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Deformation Mechanisms and Residual Stress Distributions in B4C-TiB2 Directionally Solidified Eutectics
R White, EC Dickey
Published online by Cambridge University Press:

01 August 2010, pp. 216-217
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Investigation of Baddeleyite Phase Found in Martian Meteorites
J Li, T Malis, C Herd
Published online by Cambridge University Press:

01 August 2010, pp. 218-219
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A 360º Rotatable Cryo-FIB Stage for Micromachining Frozen-Hydrated Specimens for Cryo-Electron Tomography
A Rigort, F Bäuerlein, T Laugks, M Hayles, C Mathisen, B Lich, R Morrison, A Leis, W Baumeister, J Plitzko
Published online by Cambridge University Press:

01 August 2010, pp. 220-221
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source
S Kellogg, R Schampers, S Zhang, A Graupera, T Miller, WD Laur, A Dirriwachter
Published online by Cambridge University Press:

01 August 2010, pp. 222-223
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Focused Ion Beam Investigations on Cement Based Materials in Aggressive Aqueous Environments
T Scherer, M Schwotzer, C Kübel, A Gerdes
Published online by Cambridge University Press:

01 August 2010, pp. 224-225
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

FIB-SEM Nanotomography in Materials and Life Science at EPFL
M Cantoni, G Knott, C Hébert
Published online by Cambridge University Press:

01 August 2010, pp. 226-227
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Site-Specific Plan-View Sample Preparation in the FIB
S McKernan, Y Zhu, J Xie
Published online by Cambridge University Press:

01 August 2010, pp. 228-229
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices
J Gazda, J Duarte, F Daby-Merrill
Published online by Cambridge University Press:

01 August 2010, pp. 230-231
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

FIB Cross-sections of Cells on a Patch Clamp Chip
J Fraser, D Salim, C Py, D Martinez, T Comas, R Monette
Published online by Cambridge University Press:

01 August 2010, pp. 232-233
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Characterization of Pseudomonas Fluorescens Bacteria on Polyurethane Using DB-FIB, SEM and STEM
A Blankemeier, DE Huber, HL Fraser, W Goodson, REA Williams, HO Colijn
Published online by Cambridge University Press:

01 August 2010, pp. 234-235
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Lithographically Defined Epitaxy via Focused Ion Beam Induced Lattice Damage
BD Myers, B Stevens, S Barnett, VP Dravid
Published online by Cambridge University Press:

01 August 2010, pp. 236-237
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

FIB Clean Up of ToF-SIMS Craters for Microstructural Characterization
VS Smentkowski, D Ellis
Published online by Cambridge University Press:

01 August 2010, pp. 238-239
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Computational Aspects in Quantitative EELS
J Verbeeck, S Van Aert, L Zhang, T Haiyan, P Schattshneider, A Rosenauer
Published online by Cambridge University Press:

01 August 2010, pp. 240-241
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Atomic-Scale EELS Maps: It’s Not Resolution, But Contrast
HL Xin, L Fitting-Kourkoutis, JA Mundy, H Zheng, DA Muller
Published online by Cambridge University Press:

01 August 2010, pp. 242-243
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Rapid Methods for Dynamic Autotuning
AR Lupini, SJ Pennycook
Published online by Cambridge University Press:

01 August 2010, pp. 244-245
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Image Simulations of Defect Images in STEM Observation Mode
M De Graef
Published online by Cambridge University Press:

01 August 2010, pp. 246-247
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 16 - July 2010

Instrumentation and Techniques Symposia

FIB Science and Applications in Materials and Biology

Abstract

FIB and TEM Studies of Diamond Films Prepared by Laser-Assisted Combustion Flame Deposition in Open Atmosphere

Fabrication and Model Simulation of the Ring-shaped Gate Carbon Nanotube Emitter Arrays

Effectiveness of Environmental Control for the Ultrastructural Study of Buttery Materials Using Air Protection Holder and NB5000/HD-2700 System

An Analysis of Li Ion Secondary Battery Materials by Using Focused Ion Beam Micro-sampling Technique and Cold Field Emission Scanning Transmission Electron Microscope

Deformation Mechanisms and Residual Stress Distributions in B4C-TiB2 Directionally Solidified Eutectics

Investigation of Baddeleyite Phase Found in Martian Meteorites

A 360º Rotatable Cryo-FIB Stage for Micromachining Frozen-Hydrated Specimens for Cryo-Electron Tomography

High Throughput Sample Preparation and Analysis Using an Inductively Coupled Plasma (ICP) Focused Ion Beam Source

Focused Ion Beam Investigations on Cement Based Materials in Aggressive Aqueous Environments

FIB-SEM Nanotomography in Materials and Life Science at EPFL

Site-Specific Plan-View Sample Preparation in the FIB

Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices

FIB Cross-sections of Cells on a Patch Clamp Chip

Characterization of Pseudomonas Fluorescens Bacteria on Polyurethane Using DB-FIB, SEM and STEM

Lithographically Defined Epitaxy via Focused Ion Beam Induced Lattice Damage

FIB Clean Up of ToF-SIMS Craters for Microstructural Characterization

Computational Aspects of Data Visualization and Quantitative Microscopy and Microanalysis

Abstract

Computational Aspects in Quantitative EELS

Atomic-Scale EELS Maps: It’s Not Resolution, But Contrast

Rapid Methods for Dynamic Autotuning

Image Simulations of Defect Images in STEM Observation Mode

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 16 - July 2010

Instrumentation and Techniques Symposia

FIB Science and Applications in Materials and Biology

Abstract

Computational Aspects of Data Visualization and Quantitative Microscopy and Microanalysis

Abstract