Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 16
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 16 - July 2010

Contents

Page 12 of 57

Instrumentation and Techniques Symposia

FIB Science and Applications in Materials and Biology

Abstract

  • Multiple Double XTEM Sample Preparation of Sub-10 nm Diameter Si Nanowires

  • L Gignac, S Mittal, S Bansaruntip, G Cohen, J Sleight
  • Published online by Cambridge University Press:
    01 August 2010, pp. 168-169
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Ultra-thin TEM Sample Preparation with Advanced Backside FIB Milling Method

  • H-J Kang, JH Kim, JW Oh, TS Back, HJ Kim
  • Published online by Cambridge University Press:
    01 August 2010, pp. 170-171
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Quantitative Assessment of TEM-Sample Warping Caused by FIB Preparation

  • R Salzer, A Graff, M Simon, F Altmann
  • Published online by Cambridge University Press:
    01 August 2010, pp. 172-173
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Application of Focus Ion Beam Technique for TEM Multilayer Materials Examination

  • J Wojewoda-Budka, P Zieba, J Morgiel, N Sobczak, R Nowak
  • Published online by Cambridge University Press:
    01 August 2010, pp. 174-175
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Methodologies for Quantifying Milling Acuity in Focused Ion Beam Systems

  • C Rue, R Young
  • Published online by Cambridge University Press:
    01 August 2010, pp. 176-177
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Cryo-FIB Preparation for Cryo-TEM Tomography

  • M Marko, C Hsieh, D Vetter, NJ Salmon, C Mannella
  • Published online by Cambridge University Press:
    01 August 2010, pp. 178-179
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Ion Beam Nanodissection for 3D Compositional Mapping of Mammalian Cells

  • J Fu, K Narayan, TJ Prosa, S Subramaniam
  • Published online by Cambridge University Press:
    01 August 2010, pp. 180-181
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging Transient Blood Vessel Fusion Events by Correlative Volume Electron Microscopy

  • H Armer, G Mariggi, K Png, C Genoud, A Monteith, A Bushby, H Gerhardt, L Collinson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 182-183
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • 3D Microanalysis of Biological Specimen Using FIB SEM

  • K Scott
  • Published online by Cambridge University Press:
    01 August 2010, pp. 184-185
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Integrative Cryo-Correlative Microscopy Approaches

  • A Rigort, C Mathisen, U Boehm, A Leis, B Lich, M Hayles, T Laugks, W Baumeister, J Plitzko
  • Published online by Cambridge University Press:
    01 August 2010, pp. 186-187
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Three Dimensional Ultrastructural Analysis of CNS Axons Using Serial Ion-Abrasion Scanning Electron Microscopy (SIA-SEM)

  • G Kidd, A Avishai, N Ohno, X Yin, N Avishai, A Heuer, B Trapp
  • Published online by Cambridge University Press:
    01 August 2010, pp. 188-189
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Focused Ion Beam Fabrication of Isolated Nanopores in Membranes: Overcoming Effects of Channeling

  • DP Adams, VC Hodges, M Vasile, N Patterson
  • Published online by Cambridge University Press:
    01 August 2010, pp. 190-191
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Problems with Measuring Beam Size of a Focused Ion Beam System by Means of the Rise-Distance

  • L Roussel, J Orloff
  • Published online by Cambridge University Press:
    01 August 2010, pp. 192-193
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Direct-write Focused Ion Beam Lithography

  • A Joshi-Imre, L Ocola, J Klingfus
  • Published online by Cambridge University Press:
    01 August 2010, pp. 194-195
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Focused Ion Beam Hard Mask: Insights into the Mechanism and a New Application for Photonic Structures

  • W McKenzie, M Hiscocks, F Ladouceur, P Munroe
  • Published online by Cambridge University Press:
    01 August 2010, pp. 196-197
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Fabrication and Characterization of Ultra-High Aspect Ratio Features in Gold Using the Helium Ion Microscope

  • VS Smentkowski, R Potyrailo, L Scipioni, D Ferranti
  • Published online by Cambridge University Press:
    01 August 2010, pp. 198-199
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging of Bio-Compatible Polymers in the Helium Ion Microscope

  • J Notte, L Farkas, L Scipioni, I Smith
  • Published online by Cambridge University Press:
    01 August 2010, pp. 200-201
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Nanofabrication with a High Resolution Helium Ion Beam

  • E van Veldhoven, V Sidorkin, P Chen, P Alkemade, E van der Drift, H Salemink, HW Zandbergen, D Maas
  • Published online by Cambridge University Press:
    01 August 2010, pp. 202-203
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Repeatability of Automated FIB Prepared TEM Samples with Low keV Cleaning

  • M Moriarty, J Blackwood, J Arjavac
  • Published online by Cambridge University Press:
    01 August 2010, pp. 204-205
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Sputtering Behavior of Polymeric Materials During Focused Ion Beam Nanomachining

  • KC Wong, AD Batchelor, CM Balik, DP Griffis
  • Published online by Cambridge University Press:
    01 August 2010, pp. 206-207
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 12 of 57