Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
  1. Home
  2. Journals
  3. Microscopy and Microanalysis
  4. Volume 16
Journal Home
Refine listing

Refine listing

Access:
Publication date:
Topic: Show more

Actions for selected content:

Select all | Deselect all
  • View selected items
  • Export citations
  • Download PDF (zip)
  • Save to Kindle
  • Save to Dropbox
  • Save to Google Drive

Save Search

You can save your searches here and later view and run them again in "My saved searches".

Please provide a title, maximum of 40 characters.
Cancel
×
< Back to all issues

Volume 16 - July 2010

Contents

Page 10 of 57

Instrumentation and Techniques Symposia

Aberration-Corrected Electron Microscopy: Exploring Materials Through New Eyes

Abstract

  • Atom-by-Atom Analysis of Rare-Earth Dopants implanted in Silicon

  • M Couillard, G Radtke, AP Knights, GA Botton
  • Published online by Cambridge University Press:
    01 August 2010, pp. 90-91
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Imaging of Light Atoms in the Presence of Heavy Atomic Columns

  • MP Oxley, HJ Chang, AY Borisevich, M Varela, SJ Pennycook
  • Published online by Cambridge University Press:
    01 August 2010, pp. 92-93
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • New Possibilities for Off-axis Electron Holography by Hardware Aberration Correctors

  • M Linck, J Sickmann, P Hartel, H Müller
  • Published online by Cambridge University Press:
    01 August 2010, pp. 94-95
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic Configuration of Planar Defects in Multiferroic Ca-doped BiFeO3 Films

  • MD Rossell, QM Ramasse, R Erni, C-H Yang, R Ramesh
  • Published online by Cambridge University Press:
    01 August 2010, pp. 96-97
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Dark Field Imaging of Isolated Heavy Atoms in a Transition Metal Matrix

  • MD Shannon, GB Shannon
  • Published online by Cambridge University Press:
    01 August 2010, pp. 98-99
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Strain-Enhanced Ionic Conductivity

  • TJ Pennycook, M Varela, MJ Beck, J Garcia-Barriocanal, FY Bruno, C Leon, J Santamaria, ST Pantelides, SJ Pennycook
  • Published online by Cambridge University Press:
    01 August 2010, pp. 100-101
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron Microscope

  • H Inada, M Konno, Y Suzuki, K Nakamura, J Wall, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 102-103
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Mapping Local Optical Densities of States in Finite Si Photonic Structures with Monochromated, Nanoscale Electron Spectroscopy

  • JJ Cha, Z Yu, E Smith, M Couillard, S Fan, DA Muller
  • Published online by Cambridge University Press:
    01 August 2010, pp. 106-107
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Uncovering Interface Structure by Column Shape Analysis in ADF STEM Images

  • AY Borisevich, OS Ovchinnikov, HJ Chang, MP Oxley, P Yu, R Ramesh, SJ Pennycook, SV Kalinin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 108-109
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Surface Channeling in Aberration-corrected STEM of Nanostructures

  • J Liu, LF Allard, Jr
  • Published online by Cambridge University Press:
    01 August 2010, pp. 110-111
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Data Processing Techniques for Aberration-Corrected STEM

  • MC Sarahan, QM Ramasse, ND Browning
  • Published online by Cambridge University Press:
    01 August 2010, pp. 112-113
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Benefits of Simultaneous Cc- and Cs-Correction

  • P Hartel, H Müller, S Uhlemann, J Zach, M Haider
  • Published online by Cambridge University Press:
    01 August 2010, pp. 114-115
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Chromatic Aberration Correction by Combination Concave Lens

  • H Sawada, F Hosokawa, T Sasaki, S Yuasa, M Kawazoe, M Terao, T Kaneyama, Y Kondo, K Kimoto, K Suenaga
  • Published online by Cambridge University Press:
    01 August 2010, pp. 116-117
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Advantages of Monochromated Low Voltage Aberration Corrected TEM

  • DC Bell, C Russo, S Meyer, G Benner, M Haider
  • Published online by Cambridge University Press:
    01 August 2010, pp. 118-119
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Ultra-High-Resolution Transmission Electron Microscopy of Atomically Thin Hexagonal Boron Nitride (h-BN)

  • N Alem, R Erni, C Kisielowski, MD Rossell, W Gannett, A Zettl
  • Published online by Cambridge University Press:
    01 August 2010, pp. 120-121
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • The Impact of Aberration-Corrected Transmission Electron Microscopy on Catalysis Investigations

  • P Specht, R Gulotty, Jr, D Barton, R Cieslinski, S Rozeveld, J Kang, C Kisielowski
  • Published online by Cambridge University Press:
    01 August 2010, pp. 122-123
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic-Resolution STEM Imaging of Materials Using a Segmented Annular All Field Detector

  • N Shibata, SD Findlay, Y Kohno, H Sawada, Y Kondo, Y Ikuhara
  • Published online by Cambridge University Press:
    01 August 2010, pp. 124-125
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High-Speed, Hardware-Synchronized STEM EELS Spectrum-Imaging Using a Next Generation Post-Column Imaging Filter

  • PJ Thomas, C Trevor, E Strohbehn, J Wilbrink, RD Twesten, A Gubbens
  • Published online by Cambridge University Press:
    01 August 2010, pp. 126-127
    • Article
      • You have access
    • PDF
    • Export citation

  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 10 of 57