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Volume 16 - July 2010

Contents

Page 11 of 57

Instrumentation and Techniques Symposia

Aberration-Corrected Electron Microscopy: Exploring Materials Through New Eyes

Abstract

  • High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope

  • M Konno, Y Suzuki, H Inada, K Nakamura, K Kimoto, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 128-129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope

  • R Cieslinski, S Rozeveld, J Huang, P Specht, C Kisielowski
  • Published online by Cambridge University Press:
    01 August 2010, pp. 130-131
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Limitations in Detecting a Single Dopant Atom Inside a Bulk Specimen

  • A Mittal, KA Mkhoyan
  • Published online by Cambridge University Press:
    01 August 2010, pp. 132-133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • On Direct Observation of Diffusion by Aberration-Corrected HREM

  • JT McKeown, Y-W Kim, WT Petuskey, M O'Keeffe, U Weierstall, JCH Spence
  • Published online by Cambridge University Press:
    01 August 2010, pp. 134-135
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Minimizing 6-fold Symmetry and Chromatic Aberration by Using Ultra High Resolution Lens in Cs-Corrected STEM

  • K Nakamura, H Inada, M Konno, Y Suzuki, K Kimoto
  • Published online by Cambridge University Press:
    01 August 2010, pp. 136-137
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope

  • MP Balogh, I Dutta
  • Published online by Cambridge University Press:
    01 August 2010, pp. 138-139
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Determination of Camera Modulation-Transfer Function by Electron Holography

  • RA McLeod, M Malac
  • Published online by Cambridge University Press:
    01 August 2010, pp. 140-141
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Aberration-Corrected Lorentz Microscopy

  • NT Nuhfer, A Budruk, M De Graef
  • Published online by Cambridge University Press:
    01 August 2010, pp. 142-143
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • 3D Correlative Analytical STEM at the Atomic Scale

  • DC Bell, R Schillinger, D Kolmykov
  • Published online by Cambridge University Press:
    01 August 2010, pp. 144-145
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Atomic Scale Characterization of LSFMO Thin Films Using Aberration Corrected STEM

  • M Gu, Y Takamura, ND Browning
  • Published online by Cambridge University Press:
    01 August 2010, pp. 146-147
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Can We Solve the Atomic Structure of Small Au clusters by HAADF-STEM?

  • ZW Wang, F Yin, A Bruma, RE Palmer
  • Published online by Cambridge University Press:
    01 August 2010, pp. 148-149
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Geometric Limits on Spatial Resolution for Cs Corrected STEM Analysis of Thick TEM Lamellae

  • J Bruley, J Ringnalda
  • Published online by Cambridge University Press:
    01 August 2010, pp. 150-151
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Determining Resolution in an Aberration-Corrected Era: Why Your Probe Is Larger Than You Thought

  • R Hovden, HL Xin, DA Muller
  • Published online by Cambridge University Press:
    01 August 2010, pp. 152-153
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • High-Speed Direct-Detection Electron Detector for the TEAM Project

  • P Denes, M Battaglia, D Contarato, D Doering, P Giubilato, D Gnani, B Krieger, VR Radmilovic
  • Published online by Cambridge University Press:
    01 August 2010, pp. 156-157
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Towards the Thinking Microscope

  • OS Ovchinnikov, S Jesse, SV Kalinin, HJ Chang, SJ Pennycook, AY Borisevich
  • Published online by Cambridge University Press:
    01 August 2010, pp. 160-161
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Visualization of Lithium Atoms in LiV2O4 by a Spherical Aberration Corrected Electron Microscope

  • Y Oshima, H Sawada, E Okunishi, Y Kondo, S Niitaka, H Takagi, Y Tanishiro, K Takayanagi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 162-163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • A Simple Autofocus Technique for Aberration Corrected TEM

  • G Möbus
  • Published online by Cambridge University Press:
    01 August 2010, pp. 164-165
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

FIB Science and Applications in Materials and Biology

Abstract

  • Latest Developments in FIB Technology and Applications

  • L Giannuzzi
  • Published online by Cambridge University Press:
    01 August 2010, pp. 166-167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 11 of 57