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New Possibilities for Off-axis Electron Holography by Hardware Aberration Correctors

Published online by Cambridge University Press:  01 August 2010

M Linck
Affiliation:
Technische Universitaet Dresden, Germany
J Sickmann
Affiliation:
Technische Universitaet Dresden, Germany
P Hartel
Affiliation:
CEOS Company, Germany
H Müller
Affiliation:
CEOS Company, Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010