Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices

J Gazda; J Duarte; F Daby-Merrill

doi:10.1017/S1431927610059957

Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices

Published online by Cambridge University Press: 01 August 2010

J Gazda ,

J Duarte and

F Daby-Merrill

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J Gazda: Affiliation:
Cerium Laboratories
J Duarte: Affiliation:
Cerium Laboratories
F Daby-Merrill: Affiliation:
Cerium Laboratories

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 230 - 231

DOI: https://doi.org/10.1017/S1431927610059957 [Opens in a new window]

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Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices

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