Microscopy and Microanalysis: Volume 8 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract

Real Time Color Scans with Scanning Electron Microscopes – A New Application of the XFlash® X-ray Detector Technology

Exploring the Valence Electron Distribution in High Temperature Superconductors with a Focused Electron Probe

Refinement of Crystal Structural Parameters and Charge Density using Convergent-Beam Electron Diffraction

Quantitative Convergent Beam Electron Diffraction

Bloch Wave Degeneracies and Critical Voltage Effects in CBED patterns

How to Select the Items for the Shopping List of Future High Resolution Electron Microscopists?

The 3D structure of a complex quasicrystal approximant determined by electron crystallography

HRTEM Resolution Extension for Interface by Gerchberg-Saxton Algorithm with Supported Constraint

The collection of electron diffraction intensity data and their use in structure determination

The Accuracy of Crystal Structure Refinement from Electron Diffraction Data using Parallel Beam Illumination

Single Crystal Electron Crystallography on Organic Molecules

Discussion of Ways to Energy-Filter the Electron Backscattering Pattern (EBSP) in the Scanning Electron Microscope (SEM).

EBSD Analysis Optimised for Twin-related Boundaries

An Assessment of the Pros and Cons of Low Voltage X-ray Analysis in the SEM

About the Topographic Contrast in LVSEM

High Resolution Examination Of Biological Samples Using Field Emission Scanning Electron Microscopy

Physics of Low Voltage Scanning Electron Microscopy

Advanced Instrumentation for Low Voltage Scanning Microscopy

Low Voltage Energy Dispersive Quantitative X-Ray Microanalysis of Inorganic Light Elements in Bulk Frozen Hydrated Biological Specimens

New FESEM Design for 1nm at 1kV Imaging, EDS and BSE Nanoanalysis, and a Discussion of Diffraction Limits, Depth of Field and the Future

Microscopy and Microanalysis

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Volume 8 - August 2002

Abstract