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The collection of electron diffraction intensity data and their use in structure determination

Published online by Cambridge University Press:  01 August 2002

J. Gjonnes ,
V. Hansen  and
X.Z. Li
J. Gjonnes
Affiliation:
Center for Materials Science, University of Oslo, Gaustadalleen 21 N-0349 Oslo, Norway
V. Hansen
Affiliation:
Stavanger University College, Departement of Technology and Natural Sciences, P.O. Box 2557 Ullandhaug N-4091 Stavanger, Norway
X.Z. Li
Affiliation:
Walter Scott Engineering Center, University of Nebraska, Lincoln, NE 68588-0656. USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 100 - 101
Copyright
Copyright © Microscopy Society of America 2002