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Discussion of Ways to Energy-Filter the Electron Backscattering Pattern (EBSP) in the Scanning Electron Microscope (SEM).

Published online by Cambridge University Press:  01 November 2002

Oliver C. Wells
Oliver C. Wells*
Affiliation:
Research Staff Member Emeritus, IBM Research Division, PO Box 218, Yorktown Heights, NY 10598

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 106 - 107
Copyright
Copyright © Microscopy Society of America 2002