Hostname: page-component-8448b6f56d-wq2xx Total loading time: 0 Render date: 2024-04-20T01:33:59.266Z Has data issue: false hasContentIssue false
  • English
  • Français

Refinement of Crystal Structural Parameters and Charge Density using Convergent-Beam Electron Diffraction

Published online by Cambridge University Press:  01 November 2002

K. Tsuda ,
Y. Ogata  and
M. Tanaka
K. Tsuda
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, JAPAN
Y. Ogata
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, JAPAN
M. Tanaka
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, JAPAN

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 88 - 89
Copyright
Copyright © Microscopy Society of America 2002