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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - August 2002

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Scientific Program

Abstract

Contributions of Elastically and Inelastically Scattered Electrons to High–Resolution Off–Axis Electron Holograms – a Quantitative Analysis

Other

Exhibitor Listing and Floor Plans

Vendor Directory

Abstract

Contributions of Elastically and Inelastically Scattered Electrons to High-Resolution Off-Axis Electron Holograms – a Quantitative Analysis

Other

Author Index

Abstract

Mapping of Process Induced Dopant Redistributions by Electron Holography

Other

Index to Advertisers

Abstract

Electron Holographic Characterization of Nanoscale Magnetic and Electrostatic Fields

Electron Holographic Characterization of Nanoscale Magnetic and Electrostatic Fields

Other

Microscopy and Microanalysis 2002: Presidents

Abstract

The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased p-n Junctions from Electron Holograms

Foreword

Letter from the Retiring Editor

Comparison of Fib Tem Specimen Preparation Methods

Looking at Prion Diseases in situ with Infrared Microscopy

Focused Ion Beam Based Sample Preparation Techniques

A Newly Developed Fib System For Tem Specimen Preparation

FIB Damage in Silicon: Amorphization or Redeposition?

Gallium Phase Formation in Cu and Other FCC Metals During Near-Normal Incidence Ga-FIB Milling and Techniques to Avoid this Phenomenon

Microscopy and Microanalysis

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Volume 8 - August 2002

Other

Abstract

Other

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Other

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