Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 36 of 48

Problem Solving Using Microanalytical Techniques

Research Article

Wavelength Dispersive X-ray Spectrometry Element Mapping and Mineralogy Based Manipulation: Assessment as a Method for Distinguishing Forensic Soil Samples
CS Schwandt
Published online by Cambridge University Press:

03 August 2008, pp. 1106-1107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving
R Wuhrer, K Moran, MR Phillips
Published online by Cambridge University Press:

03 August 2008, pp. 1108-1109
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Compositional Variations and Modeling in Low Alloy Steel Welds
JJ McGee, DB Knorr
Published online by Cambridge University Press:

03 August 2008, pp. 1110-1111
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Comparison of the Defect Microstructure of Silicon Dioxide Thin Films and Buried Oxide Layers Determined Using Cathodoluminescence Microanalysis
MA Stevens-Kalceff
Published online by Cambridge University Press:

03 August 2008, pp. 1112-1113
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Enhanced Raman (SERS) Nanoparticle Delivery Device for in-situ Sample Analysis
TJ Tague Jr, M Leona
Published online by Cambridge University Press:

03 August 2008, pp. 1114-1115
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in High Resolution CT and Dimensional Measuring
D Moller-Gunderson, K Brockdorf, O Brunke
Published online by Cambridge University Press:

03 August 2008, pp. 1116-1117
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Enhancing Contrast of Al Traces on Si Substrates using Low-voltage SEM-hosted XRM
BC Gundrum, JA Hunt, MA Zurbuchen
Published online by Cambridge University Press:

03 August 2008, pp. 1118-1119
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Identifying Foreign Material Contamination in Food and Food Ingredients
VL St. Jeor, AD Lape, AR Muroski, C McGuire, DL Elmore
Published online by Cambridge University Press:

03 August 2008, pp. 1120-1121
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

An Ex-Situ TEM Investigation into the Effect of Successive Reduction-Oxidation-Reduction Treatments on Closely Spaced Copper Metal Particles
CE Kliewer
Published online by Cambridge University Press:

03 August 2008, pp. 1122-1123
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A DigitalMicrograph™ Script to Characterize Elliptical Distortion of Electron Diffraction Patterns in TEM
VDH Hou
Published online by Cambridge University Press:

03 August 2008, pp. 1124-1125
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Method to Correct Elliptical Distortion of Diffraction Patterns in TEM
VDH Hou, D Li
Published online by Cambridge University Press:

03 August 2008, pp. 1126-1127
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Distortion Minimization of CBED Patterns in TEM
VDH Hou
Published online by Cambridge University Press:

03 August 2008, pp. 1128-1129
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Combined Raman Spectroscopy and SEM Analysis of CVD Grown Carbon Nanotubes
B Duong, Y Peng, M Ellis, S Seraphin, H Xin
Published online by Cambridge University Press:

03 August 2008, pp. 1130-1131
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Effect of Zr/Ti Ratio on the Microstructure of PZT Film
YH Oh, BW Koo, JY Jo, TW Noh, S-H Kim, Y-W Kim
Published online by Cambridge University Press:

03 August 2008, pp. 1132-1133
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Comparison of elemental distribution profiles across Cu(In, Ga)Se2 solar-cell absorbers acquired by various techniques
D Abou-Ras, CA Kaufmann, A Eicke, M Döbeli, B Gade, T Nunney
Published online by Cambridge University Press:

03 August 2008, pp. 1134-1135
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

The Quantitative Analysis of Super-Low Phosphorus Content of SUS316L Type Stainless Steel With EPMA Calibration Curve Method
T Kimura, S Iwasaki, K Sakuraya, S Tanuma
Published online by Cambridge University Press:

03 August 2008, pp. 1136-1137
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Microscopy Study of Germanium Glass Vitrified by High Pressure Melt-Quench
VC Solomon, MH Bhat, V Molinero, E Soignard, S Sastry, JL Yarger, AC Angell
Published online by Cambridge University Press:

03 August 2008, pp. 1138-1139
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advanced Large Active Area SDD for X-Ray Spectroscopy
VD Saveliev, CR Tull, L Feng, S Barkan, M Takahashi, EV Damron
Published online by Cambridge University Press:

03 August 2008, pp. 1140-1141
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM and SEM Investigation on Oxidised Ge-based Clathrates
C Hébert, B Bartova, M Cantoni, U Aydemir, M Baitinger
Published online by Cambridge University Press:

03 August 2008, pp. 1142-1143
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Computer-Controlled Polishing Preparation and Subsequent Mounting of Samples for Low-voltage X-Ray Tomography
P Prasad, D Erwin, JA Hunt
Published online by Cambridge University Press:

03 August 2008, pp. 1144-1145
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 36 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article

Wavelength Dispersive X-ray Spectrometry Element Mapping and Mineralogy Based Manipulation: Assessment as a Method for Distinguishing Forensic Soil Samples

Multi-Detector X-Ray Mapping and Generation of Correction Factor Images for Problem Solving

Compositional Variations and Modeling in Low Alloy Steel Welds

Comparison of the Defect Microstructure of Silicon Dioxide Thin Films and Buried Oxide Layers Determined Using Cathodoluminescence Microanalysis

Surface Enhanced Raman (SERS) Nanoparticle Delivery Device for in-situ Sample Analysis

Advances in High Resolution CT and Dimensional Measuring

Enhancing Contrast of Al Traces on Si Substrates using Low-voltage SEM-hosted XRM

Identifying Foreign Material Contamination in Food and Food Ingredients

An Ex-Situ TEM Investigation into the Effect of Successive Reduction-Oxidation-Reduction Treatments on Closely Spaced Copper Metal Particles

A DigitalMicrograph™ Script to Characterize Elliptical Distortion of Electron Diffraction Patterns in TEM

A Method to Correct Elliptical Distortion of Diffraction Patterns in TEM

Distortion Minimization of CBED Patterns in TEM

Combined Raman Spectroscopy and SEM Analysis of CVD Grown Carbon Nanotubes

Effect of Zr/Ti Ratio on the Microstructure of PZT Film

Comparison of elemental distribution profiles across Cu(In, Ga)Se2 solar-cell absorbers acquired by various techniques

The Quantitative Analysis of Super-Low Phosphorus Content of SUS316L Type Stainless Steel With EPMA Calibration Curve Method

Electron Microscopy Study of Germanium Glass Vitrified by High Pressure Melt-Quench

Advanced Large Active Area SDD for X-Ray Spectroscopy

TEM and SEM Investigation on Oxidised Ge-based Clathrates

Computer-Controlled Polishing Preparation and Subsequent Mounting of Samples for Low-voltage X-Ray Tomography

Microscopy and Microanalysis

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Volume 14 - August 2008

Problem Solving Using Microanalytical Techniques

Research Article