Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 33 of 48

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Large area patterning using ion-beam lithography
LE Ocala, A Imre
Published online by Cambridge University Press:

03 August 2008, pp. 986-987
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB Fabrication of Metallic Nanostructures on End-faces of Cleaved Optical Fibers for Chemical Sensing Applications
PE Russell, A Dhawan, J Gleeson
Published online by Cambridge University Press:

03 August 2008, pp. 988-989
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Novel Thin Film Deposition Methods in a CrossBeam® FIB-SEM Platform Using an OmniGISTM
EL Principe, C Hartfield, R Kruger, A Smith
Published online by Cambridge University Press:

03 August 2008, pp. 990-991
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Site-Specific Studies of Electrical Heterogeneities in Ni-BaTiO3 Multilayer Ceramic Capacitors Using FIB and AEM
GY Yang, PJ Moses, EC Dickey, CA Randall
Published online by Cambridge University Press:

03 August 2008, pp. 992-993
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sub-stage with Remote Control of Specimen Rotation for Use in FIB/SEM Tools
DJ MacMahon
Published online by Cambridge University Press:

03 August 2008, pp. 994-995
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB preparation of cross-sectional polymer thin film TEM samples
S Kim, A Minor
Published online by Cambridge University Press:

03 August 2008, pp. 996-997
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sample Preparation for Aberration Corrected Microscopy
A Genç, D Huber, D Basile, HL Fraser, P Fischione
Published online by Cambridge University Press:

03 August 2008, pp. 998-999
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-Situ Sample Preparation and Modeling of SEM-STEM Imaging
RJ Young, A Buxbaum, B Peterson, R Schampers
Published online by Cambridge University Press:

03 August 2008, pp. 1000-1001
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advanced FIB-based sample preparation for 3D characterization of 45nm ICs
F Lorut, D Delille
Published online by Cambridge University Press:

03 August 2008, pp. 1002-1003
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Specimen Preparation for Cross-Section Atom Probe Analysis
D Lawrence, R Alvis, D Olson
Published online by Cambridge University Press:

03 August 2008, pp. 1004-1005
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

New FIB Fold-Out Method for TEM Cross-Section Sample Preparation
HC Floresca, J Jeon, MJ Kim
Published online by Cambridge University Press:

03 August 2008, pp. 1006-1007
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Study of FIB Damage in Carbonaceous Materials using XANES
ND Bassim, BT DeGregoio, RM Stroud, PE Fischione
Published online by Cambridge University Press:

03 August 2008, pp. 1008-1009
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

FIB and HRTEM Characterization of Surface Oxides on Polysilicon MEMS after Cyclic Loading
A Avishai, H Kahn, R Ballarini, A Heuer
Published online by Cambridge University Press:

03 August 2008, pp. 1010-1011
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Charge-contrast in SEM imaging with simultaneous ion bombardment
BD Myers, JR Wilson, VP Dravid, SA Barnett
Published online by Cambridge University Press:

03 August 2008, pp. 1012-1013
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles Using Focused Ion Beam Milling and X-ray Microanalysis
JM Conny, DB Klinedinst, S Eustis
Published online by Cambridge University Press:

03 August 2008, pp. 1014-1015
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A quantitative study on focused on beam milling in a cryogenic environment
J Fu, SB Joshi, JM Catchmark, G Ning
Published online by Cambridge University Press:

03 August 2008, pp. 1016-1017
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy
DJ Larson, PH Clifton, RL Alvis, DP Olson, J Weng, SA Gerstl, F Chen
Published online by Cambridge University Press:

03 August 2008, pp. 1018-1019
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-situ Scanning Transmission Electron Microscopy Study on the Microstructural Characterization of a TFT-LCD Panel by a FIB/SEM
YJ Park, SH Han, HN Kim
Published online by Cambridge University Press:

03 August 2008, pp. 1020-1021
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Fabricating Atom Probe Tomography Specimens from TEM foils
MK Miller, KF Russell, DT Hoelzer
Published online by Cambridge University Press:

03 August 2008, pp. 1022-1023
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Recent Advances in 3D Materials Characterization using DualBeams
W Neijssen, LY Roussel
Published online by Cambridge University Press:

03 August 2008, pp. 1024-1025
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 33 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Large area patterning using ion-beam lithography

FIB Fabrication of Metallic Nanostructures on End-faces of Cleaved Optical Fibers for Chemical Sensing Applications

Development of Novel Thin Film Deposition Methods in a CrossBeam® FIB-SEM Platform Using an OmniGISTM

Site-Specific Studies of Electrical Heterogeneities in Ni-BaTiO3 Multilayer Ceramic Capacitors Using FIB and AEM

Sub-stage with Remote Control of Specimen Rotation for Use in FIB/SEM Tools

FIB preparation of cross-sectional polymer thin film TEM samples

Sample Preparation for Aberration Corrected Microscopy

In-Situ Sample Preparation and Modeling of SEM-STEM Imaging

Advanced FIB-based sample preparation for 3D characterization of 45nm ICs

Specimen Preparation for Cross-Section Atom Probe Analysis

New FIB Fold-Out Method for TEM Cross-Section Sample Preparation

Study of FIB Damage in Carbonaceous Materials using XANES

FIB and HRTEM Characterization of Surface Oxides on Polysilicon MEMS after Cyclic Loading

Charge-contrast in SEM imaging with simultaneous ion bombardment

Assessing the Internal Structure and Composition of Climatically-Relevant Atmospheric Particles Using Focused Ion Beam Milling and X-ray Microanalysis

A quantitative study on focused on beam milling in a cryogenic environment

Repetitive Grain Boundary Chemical Analysis by Atom Probe Microscopy

In-situ Scanning Transmission Electron Microscopy Study on the Microstructural Characterization of a TFT-LCD Panel by a FIB/SEM

Fabricating Atom Probe Tomography Specimens from TEM foils

Recent Advances in 3D Materials Characterization using DualBeams

Microscopy and Microanalysis

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Volume 14 - August 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article