Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 31 of 48

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

On the Evolution of Friction-Induced Microstructures in Single Crystal Nickel
SV Prasad, JR Michael, CC Battaile, BS Majumdar
Published online by Cambridge University Press:

03 August 2008, pp. 906-907
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis
MM El-Gomati, CGH Walker, C Bonet, SP Tear, JAD Matthew
Published online by Cambridge University Press:

03 August 2008, pp. 908-909
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Artificial SEM Images for Testing Resolution-Measurement Methods
P Cizmar, AE Vladár, B Ming, MT Postek
Published online by Cambridge University Press:

03 August 2008, pp. 910-911
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Counting Electrons in Transmission Electron Microscopes
G Moldovan, X Li, P Wilshaw, AI Kirkland
Published online by Cambridge University Press:

03 August 2008, pp. 912-913
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite
F Yi, WG Stratton, PM Voyles
Published online by Cambridge University Press:

03 August 2008, pp. 914-915
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

The Use of Statistical Approach for Quantitative Strain Analyses with the Intensity Response of EBSD Systems
J Cocle, R Gauvin, S Yue
Published online by Cambridge University Press:

03 August 2008, pp. 916-917
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Predicting Visibility in Elemental Maps Derived from X-ray Spectrum Images
D Newbury, D Bright, J Davis, N Ritchie
Published online by Cambridge University Press:

03 August 2008, pp. 918-919
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis
JM Zuo, WJ Huang, A Shah, R Kröeger
Published online by Cambridge University Press:

03 August 2008, pp. 920-921
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Atomic Resolution Images in STEM
LJ Allen, AJ D'Alfonso, M Bosman, SD Findlay, MP Oxley, VJ Keast, JM LeBeau, S Stemmer
Published online by Cambridge University Press:

03 August 2008, pp. 922-923
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Critical Role of Inelastic Interactions in Quantitative Electron Microscopy
KA Mkhoyan, SE Maccagnano-Zacher, MG Thomas, J Silcox
Published online by Cambridge University Press:

03 August 2008, pp. 924-925
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Controlling Channeling Effects in Aberration-Corrected STEM Tomography
HL Xin, V Intaraprasonk, DA Muller
Published online by Cambridge University Press:

03 August 2008, pp. 926-927
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simulating Atomic Resolution STEM Images of Non-Periodic Samples
SD Findlay, AJ D'Alfonso, LJ Allen, MP Oxley, PD Nellist, EC Cosgriff, G Behan, A Kirkland, N Shibata, T Mizoguchi, Y Ikuhara
Published online by Cambridge University Press:

03 August 2008, pp. 928-929
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Image Simulation for Scanning Transmission Electron Microscopy
MP Oxley, K van Benthem, SJ Pennycook
Published online by Cambridge University Press:

03 August 2008, pp. 930-931
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Geometrical Interpretation and Simulation of HOLZ Patterns
XZ Li
Published online by Cambridge University Press:

03 August 2008, pp. 932-933
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

EBSD Characterization of the Deformation Behavior of Alloy 182 Weld Metal
MA Othon, MM Morra
Published online by Cambridge University Press:

03 August 2008, pp. 934-935
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Computation of Current Density in Particle Beams
M Oral, A Vladár
Published online by Cambridge University Press:

03 August 2008, pp. 936-937
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

HAADF Imaging and MD Simulations of Microtwining Partial Dislocations in Nickel Based Superalloy Rene 104,
L Kovarik, RR Unocic, J Li, MJ Mills
Published online by Cambridge University Press:

03 August 2008, pp. 938-939
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

High-resolution electron imaging of amorphous layers with aberration-corrected probes
S Maccagnano-Zacher, A Mkhoyan, J Silcox
Published online by Cambridge University Press:

03 August 2008, pp. 940-941
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Quantitative Image Contrast Variations in STEM
K van Benthem, MP Oxley, C Kreyenschulte, SJ Pennycook
Published online by Cambridge University Press:

03 August 2008, pp. 942-943
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental Solids
CGH Walker, MM El-Gomati, AMD Assa'd, M Zadražil
Published online by Cambridge University Press:

03 August 2008, pp. 944-945
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 31 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

On the Evolution of Friction-Induced Microstructures in Single Crystal Nickel

Secondary, Backscattered and Low Energy Loss electrons in the SEM: Quantification for nano analysis

Artificial SEM Images for Testing Resolution-Measurement Methods

Counting Electrons in Transmission Electron Microscopes

Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

The Use of Statistical Approach for Quantitative Strain Analyses with the Intensity Response of EBSD Systems

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Predicting Visibility in Elemental Maps Derived from X-ray Spectrum Images

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Atomic Resolution Images in STEM

Critical Role of Inelastic Interactions in Quantitative Electron Microscopy

Controlling Channeling Effects in Aberration-Corrected STEM Tomography

Simulating Atomic Resolution STEM Images of Non-Periodic Samples

Quantitative Image Simulation for Scanning Transmission Electron Microscopy

Geometrical Interpretation and Simulation of HOLZ Patterns

EBSD Characterization of the Deformation Behavior of Alloy 182 Weld Metal

Computation of Current Density in Particle Beams

HAADF Imaging and MD Simulations of Microtwining Partial Dislocations in Nickel Based Superalloy Rene 104,

High-resolution electron imaging of amorphous layers with aberration-corrected probes

Quantitative Image Contrast Variations in STEM

An Experimental and Monte Carlo Study of Secondary Electron Emission from Elemental Solids

Microscopy and Microanalysis

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Volume 14 - August 2008

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article

Simulation of Microscopy, Microanalysis, and Microscopic Phenomena

Research Article