Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 28 of 48

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Research Article

Enhanced Mapping of C Kα with a Grazing-incidence X-ray Optic
G Brown, D O'Hara
Published online by Cambridge University Press:

03 August 2008, pp. 786-787
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

TEM Accessory Instrumentation and Automation

Research Article

Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples
N Salmon, D Vetter, EA Stach
Published online by Cambridge University Press:

03 August 2008, pp. 788-789
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution
XF Zhang
Published online by Cambridge University Press:

03 August 2008, pp. 790-791
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures
LF Allard, WC Bigelow, D Nackashi, J Damiano, SE Mick
Published online by Cambridge University Press:

03 August 2008, pp. 792-793
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Four-dimensional STEM-EELS tomography of nano-structured materials
K Jarausch, D Leonard, R Twesten, P Thomas
Published online by Cambridge University Press:

03 August 2008, pp. 794-795
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electronic structure studies of carbon materials by high energy-resolution carbon K-emission spectroscopy measurements
M Terauchi, H Nishihara, T Kyotani
Published online by Cambridge University Press:

03 August 2008, pp. 796-797
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Automated Large Scale Tilt Pair Data Collection for TEM
C Yoshioka, N Voss, J Pulokas, D Fellmann, A Cheng, B Carragher, C Potter
Published online by Cambridge University Press:

03 August 2008, pp. 798-799
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Progress on the Development of a Cc/Cs Corrector for TEAM
M Haider, P Hartel, U Loebau, R Hoeschen, H Müller, S Uhlemann, F Kahl, F Zach
Published online by Cambridge University Press:

03 August 2008, pp. 800-801
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope
S Sawada, F Hosokawa, T Kaneyama, T Tomita, Y Kondo, T Tanaka, Y Oshima, Y Tanishiro, K Takayanagi
Published online by Cambridge University Press:

03 August 2008, pp. 802-803
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Design and Characterization of 64 MegaPixel Fiber Optic Coupled CMOS Detector for Transmission Electron Microscopy
HR Tietz
Published online by Cambridge University Press:

03 August 2008, pp. 804-805
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Pixel Array Detector for Scanning Transmission Electron Microscopy
P Ercius, T Caswell, MW Tate, A Ercan, SM Gruner, D Muller
Published online by Cambridge University Press:

03 August 2008, pp. 806-807
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Fast CCD Cameras for in-situ Electron Microscopy
L Tsung, B Mollon, Y Jia, P Mooney, C Mao, M Pan
Published online by Cambridge University Press:

03 August 2008, pp. 808-809
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Gun Design for Pulsed TEM Operation
A Ziegler
Published online by Cambridge University Press:

03 August 2008, pp. 810-811
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Automated 3D Reconstruction of Serial Electron Microscopy Image Sequences Using Object Recognition
Y Lu, S Shaham
Published online by Cambridge University Press:

03 August 2008, pp. 812-813
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Double-Probe Piezo-Driving Holder for TEM
K Yamazaki, I Ishikawa, S Deguchi, Y Kondo, Y Murakami, D Shindo
Published online by Cambridge University Press:

03 August 2008, pp. 814-815
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Stage-Scanning Type Confocal STEM
A Hashimoto, M Takeguchi, M Shimojo, K Mitsuishi, K Furuya
Published online by Cambridge University Press:

03 August 2008, pp. 816-817
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Use of a commercial RF plasma cleaner in eliminating adventitious carbon contamination in an XPS system
E Strein, D Allred, MR Linford
Published online by Cambridge University Press:

03 August 2008, pp. 818-819
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Reduction of Electron Beam Induced Specimen Contaminations by Chemical Cleaning of a TEM Column Using Oxygen Plasma
S Horiuchi, T Hanada, M Ebisawa
Published online by Cambridge University Press:

03 August 2008, pp. 820-821
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Soft-X-ray emission spectroscopy study of transition intensities from the valence band to 3D core-hole of lanthanide oxides
M Terauchi, Y Yoneda
Published online by Cambridge University Press:

03 August 2008, pp. 822-823
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Transmission Electron Microscopy Techniques and Applications

Research Article

Very Low Energy TEM Diffraction of Nanostructures
B McMorran, A Cronin
Published online by Cambridge University Press:

03 August 2008, pp. 824-825
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 28 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Research Article

Enhanced Mapping of C Kα with a Grazing-incidence X-ray Optic

TEM Accessory Instrumentation and Automation

Research Article

Development of a high accuracy, large range and backlash free single-tilt/rotation (alpha-gamma) holder for precise alignment of TEM samples

Specially Designed Sample Holder and In-situ TEM for Gas-Solid Interaction Studies at an Atomic Resolution

A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures

Four-dimensional STEM-EELS tomography of nano-structured materials

Electronic structure studies of carbon materials by high energy-resolution carbon K-emission spectroscopy measurements

Automated Large Scale Tilt Pair Data Collection for TEM

Progress on the Development of a Cc/Cs Corrector for TEAM

Auto-Adjustment of Aberration Correction and Experimental Evaluation of R005 Microscope

Design and Characterization of 64 MegaPixel Fiber Optic Coupled CMOS Detector for Transmission Electron Microscopy

A Pixel Array Detector for Scanning Transmission Electron Microscopy

Development of Fast CCD Cameras for in-situ Electron Microscopy

Electron Gun Design for Pulsed TEM Operation

Automated 3D Reconstruction of Serial Electron Microscopy Image Sequences Using Object Recognition

Development of Double-Probe Piezo-Driving Holder for TEM

Development of Stage-Scanning Type Confocal STEM

Use of a commercial RF plasma cleaner in eliminating adventitious carbon contamination in an XPS system

Reduction of Electron Beam Induced Specimen Contaminations by Chemical Cleaning of a TEM Column Using Oxygen Plasma

Soft-X-ray emission spectroscopy study of transition intensities from the valence band to 3D core-hole of lanthanide oxides

Transmission Electron Microscopy Techniques and Applications

Research Article

Very Low Energy TEM Diffraction of Nanostructures

Microscopy and Microanalysis

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Actions for selected content:

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Volume 14 - August 2008

Hyperspectral Imaging, Cathodoluminescence, and Soft X-ray Analysis

Research Article

TEM Accessory Instrumentation and Automation

Research Article

Transmission Electron Microscopy Techniques and Applications

Research Article