Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 29 of 48

Transmission Electron Microscopy Techniques and Applications

Research Article

Development of New Diffraction Microscope Based on Conventional Scanning Electron Microscope
O Kamimura, T Dobashi, K Kawahara, T Abe, K Gohara
Published online by Cambridge University Press:

03 August 2008, pp. 826-827
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Measurement of Electron Beam Coherence Using a Lau Interferometer
B McMorran, A Cronin
Published online by Cambridge University Press:

03 August 2008, pp. 828-829
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Control of Parasitic Aberrations in Multipole Corrector Optics
PE Batson
Published online by Cambridge University Press:

03 August 2008, pp. 830-831
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Aberration Corrected Lorentz Microscopy for Perpendicular Magnetic Recording Media
C Phatak, JA Bain, JG Zhu, M De Graef
Published online by Cambridge University Press:

03 August 2008, pp. 832-833
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Young’s Fringes Are Not Evidence of HRTEM Resolution
MA O'Keefe, LF Allard, DA Blom
Published online by Cambridge University Press:

03 August 2008, pp. 834-835
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Development of Sample Preparation Method for Observation of Dopant Profile by Electron Holography
T Sato, H Matsumoto, M Konno, M Fukui, S Mamishin, Y Taniguchi, H Kasai
Published online by Cambridge University Press:

03 August 2008, pp. 836-837
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In-line Point Projection Holography of Titanium Oxide Nanoparticles
L Livadaru, M Malac, R Wolkow
Published online by Cambridge University Press:

03 August 2008, pp. 838-839
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Routine Phase Resolution of 2π/100 and Better in Off-axis (Electron) Holography
E Voelkl
Published online by Cambridge University Press:

03 August 2008, pp. 840-841
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

On-line Dynamic Digital Electron Holography
T Hirayama, K Yamamoto, K Urata
Published online by Cambridge University Press:

03 August 2008, pp. 842-843
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM
E Voelkl, B Jiang, ZR Dai, JP Bradley
Published online by Cambridge University Press:

03 August 2008, pp. 844-845
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Absolute Strain at the Nanoscale from HREM Images
CL Johnson, E Snoeck, MJ Hÿtch
Published online by Cambridge University Press:

03 August 2008, pp. 846-847
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Atomic Resolution Imaging of Solid State Phase Separation in a Beta-Stabilized Titanium Alloy
S Nag, A Genç, R Banerjee, HL Fraser
Published online by Cambridge University Press:

03 August 2008, pp. 848-849
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting
DR Diercks, MJ Kaufman, A Needleman
Published online by Cambridge University Press:

03 August 2008, pp. 850-851
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain Measurements of a Strained Silicon Transistor
DR Diercks, MJ Kaufman
Published online by Cambridge University Press:

03 August 2008, pp. 852-853
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Evaluating Visibility and Spatial Resolution in Electron Holography
RA McLeod, M Malac
Published online by Cambridge University Press:

03 August 2008, pp. 854-855
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Teaching Microscopy and Microanalysis

Research Article

Odyssey of a Chemical Microscopist
JG Delly
Published online by Cambridge University Press:

03 August 2008, pp. 856-857
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Remote-Access Scanning Electron Microscopy for K-12 Students: The Bugscope Project Nine Years On
C Wallace, C Conway, AM Ray, SJ Robinson
Published online by Cambridge University Press:

03 August 2008, pp. 858-859
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

AFM Learning Activities for a 7-11 Grade Nanotechnology Course
DN Leonard, PE Russell
Published online by Cambridge University Press:

03 August 2008, pp. 860-861
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Sherlock Holmes to CSI: Microscopy in the Forensic Geology Classroom
TJ Williams
Published online by Cambridge University Press:

03 August 2008, pp. 862-863
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Teaching Aids for Optical Mineralogy in the Geosciences
DE Kile
Published online by Cambridge University Press:

03 August 2008, pp. 864-865
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 29 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

Transmission Electron Microscopy Techniques and Applications

Research Article

Development of New Diffraction Microscope Based on Conventional Scanning Electron Microscope

Measurement of Electron Beam Coherence Using a Lau Interferometer

Control of Parasitic Aberrations in Multipole Corrector Optics

Aberration Corrected Lorentz Microscopy for Perpendicular Magnetic Recording Media

Young’s Fringes Are Not Evidence of HRTEM Resolution

Development of Sample Preparation Method for Observation of Dopant Profile by Electron Holography

In-line Point Projection Holography of Titanium Oxide Nanoparticles

Routine Phase Resolution of 2π/100 and Better in Off-axis (Electron) Holography

On-line Dynamic Digital Electron Holography

Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM

Absolute Strain at the Nanoscale from HREM Images

Atomic Resolution Imaging of Solid State Phase Separation in a Beta-Stabilized Titanium Alloy

Simple Method for Estimating Relaxation in Silicon from Higher Order Laue Zone Line Splitting

Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain Measurements of a Strained Silicon Transistor

Evaluating Visibility and Spatial Resolution in Electron Holography

Teaching Microscopy and Microanalysis

Research Article

Odyssey of a Chemical Microscopist

Remote-Access Scanning Electron Microscopy for K-12 Students: The Bugscope Project Nine Years On

AFM Learning Activities for a 7-11 Grade Nanotechnology Course

Sherlock Holmes to CSI: Microscopy in the Forensic Geology Classroom

Teaching Aids for Optical Mineralogy in the Geosciences

Microscopy and Microanalysis

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Volume 14 - August 2008

Transmission Electron Microscopy Techniques and Applications

Research Article

Teaching Microscopy and Microanalysis

Research Article