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Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM

Published online by Cambridge University Press:  03 August 2008

E Voelkl ,
B Jiang ,
ZR Dai  and
JP Bradley
E Voelkl
Affiliation:
FEI Company
B Jiang
Affiliation:
FEI Company
ZR Dai
Affiliation:
Lawrence Livermore National Laboratory
JP Bradley
Affiliation:
Lawrence Livermore National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 844 - 845
Copyright
© 2008 Microscopy Society of America

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