Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 34 of 48

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Critical Dimension Monitoring with STEM in Thin Film Magnetic Head Wafer Production
H Wang, J Fang, M Lederman
Published online by Cambridge University Press:

03 August 2008, pp. 1026-1027
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

OmniGIS Gas Injection System for Ion Beam Induced Deposition and Etching
DN Leonard, A Dhawan, PE Russell
Published online by Cambridge University Press:

03 August 2008, pp. 1028-1029
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Preparation of AlGaN-based High Electron Mobility Transistor Devices using Focused Ion Beam Milling
DA Cullen, DJ Smith
Published online by Cambridge University Press:

03 August 2008, pp. 1030-1031
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Problem Solving with Light Microscopy

Research Article

The Importance of Polarized Light Microscopy in the Analytical Setting
S Sparenga
Published online by Cambridge University Press:

03 August 2008, pp. 1032-1033
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microscopy Outside The Box
B Heeschen
Published online by Cambridge University Press:

03 August 2008, pp. 1034-1035
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Solving Archaeological Mysteries with the Light Microscope
M King, K Brinsko, A Bowen, S Sparenga
Published online by Cambridge University Press:

03 August 2008, pp. 1036-1037
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Dynamic Experiments in Light Microscopy
DR Rothe, R Samson, E Czerwinski
Published online by Cambridge University Press:

03 August 2008, pp. 1038-1039
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Research Article

Stereological Characterization of the Geometry of Three Dimensional Microstructures
RT DeHoff
Published online by Cambridge University Press:

03 August 2008, pp. 1040-1041
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article

3-D Cross-Correlation of Atom Probe and STEM Tomography
BP Gorman, DR Diercks, D Jaeger
Published online by Cambridge University Press:

03 August 2008, pp. 1042-1043
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Correlating Electron Tomography and Atom Probe Tomography
I Arslan, EA Marquis, M Homer, MA Hekmaty, NC Bartelt
Published online by Cambridge University Press:

03 August 2008, pp. 1044-1045
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

(S)TEM Dual Axis Tomography
A Voigt, A Yakushevska, F de Haas, W Voorhout, R Schoenmakers
Published online by Cambridge University Press:

03 August 2008, pp. 1046-1047
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Three-Dimensional Reconstruction of Au Nanoparticles Using Five Projections from an Aberration-Corrected STEM
L Jiang, P Wang, A Bleloch, P Goodhew
Published online by Cambridge University Press:

03 August 2008, pp. 1048-1049
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Discrete tomography: exploiting various forms of discreteness in electron tomography
KJ Batenburg, S Bals, J Sijbers, G Van Tendeloo
Published online by Cambridge University Press:

03 August 2008, pp. 1050-1051
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron tomography using compositional-sensitive diffraction contrast for 3D characterization of self-assembled semiconductor quantum dots
R Beanland, JC Hernandez, AM Sanchez, PA Midgley
Published online by Cambridge University Press:

03 August 2008, pp. 1052-1053
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Reconstruction of 3D Magnetic Induction Using Lorentz TEM
C Phatak, M DeGraef, A Petford-Long, M Tanase, A Imre
Published online by Cambridge University Press:

03 August 2008, pp. 1054-1055
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Tomographic Imaging Ultra-Thick Specimens with Nanometer Resolution
E Soutry, B Freitag, D Wall, D Tang, K Lu, J Loos
Published online by Cambridge University Press:

03 August 2008, pp. 1056-1057
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Data Interpretation in Real Time: Using Commodity Graphics Cards to Accelerate Tomography
CR Booth, S Markovic, R Harmon, J Wilbrink
Published online by Cambridge University Press:

03 August 2008, pp. 1058-1059
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Correlative Cryo-Light and Cryo-Electron Microscopy of Vitreous Sections
CL Schwartz, MS Ladinsky, A Hoenger
Published online by Cambridge University Press:

03 August 2008, pp. 1060-1061
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Image processing of vitreous sections
D Castano, A Al-Amoudi, A Frangakis
Published online by Cambridge University Press:

03 August 2008, pp. 1062-1063
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Cryo-Electron Tomography of Coated Vesicles and Modeling the Polyhedral Clathrin Network
JB Heymann, DC Winkler, Y-I Yim, E Eisenberg, LE Greene, AC Steven
Published online by Cambridge University Press:

03 August 2008, pp. 1064-1065
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 34 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Critical Dimension Monitoring with STEM in Thin Film Magnetic Head Wafer Production

OmniGIS Gas Injection System for Ion Beam Induced Deposition and Etching

Preparation of AlGaN-based High Electron Mobility Transistor Devices using Focused Ion Beam Milling

Problem Solving with Light Microscopy

Research Article

The Importance of Polarized Light Microscopy in the Analytical Setting

Microscopy Outside The Box

Solving Archaeological Mysteries with the Light Microscope

Dynamic Experiments in Light Microscopy

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Research Article

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article

3-D Cross-Correlation of Atom Probe and STEM Tomography

Correlating Electron Tomography and Atom Probe Tomography

(S)TEM Dual Axis Tomography

Three-Dimensional Reconstruction of Au Nanoparticles Using Five Projections from an Aberration-Corrected STEM

Discrete tomography: exploiting various forms of discreteness in electron tomography

Electron tomography using compositional-sensitive diffraction contrast for 3D characterization of self-assembled semiconductor quantum dots

Reconstruction of 3D Magnetic Induction Using Lorentz TEM

Tomographic Imaging Ultra-Thick Specimens with Nanometer Resolution

Data Interpretation in Real Time: Using Commodity Graphics Cards to Accelerate Tomography

Correlative Cryo-Light and Cryo-Electron Microscopy of Vitreous Sections

Image processing of vitreous sections

Cryo-Electron Tomography of Coated Vesicles and Modeling the Polyhedral Clathrin Network

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 14 - August 2008

FIB-Based Applications and Instrumentation Advances for the Physical and Biological Sciences

Research Article

Problem Solving with Light Microscopy

Research Article

Stereological Characterization of the Geometry of Three Dimensional Microstructures

Research Article

Advances in Electron Tomography for the Physical and Biological Sciences

Research Article