Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-07-01T17:53:01.533Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron tomography using compositional-sensitive diffraction contrast for 3D characterization of self-assembled semiconductor quantum dots

Published online by Cambridge University Press:  03 August 2008

R Beanland ,
JC Hernandez ,
AM Sanchez  and
PA Midgley
R Beanland
Affiliation:
University of Cambridge, United Kingdom
JC Hernandez
Affiliation:
University of Cambridge, United Kingdom
AM Sanchez
Affiliation:
Universidad de Cadiz, Spain
PA Midgley
Affiliation:
University of Cambridge, United Kingdom
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1052 - 1053
Copyright
© 2008 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)