Microscopy and Microanalysis: Volume 14 -

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Volume 14 - August 2008

Contents

Page 38 of 48

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images
S Wight, D Meier, M Postek, A Vladar, J Small, D Newbury
Published online by Cambridge University Press:

03 August 2008, pp. 1186-1187
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Relative Contrast in Ion and Electron Induced Secondary Electron Images
LA Giannuzzi, M Utlaut, M Scheinfein
Published online by Cambridge University Press:

03 August 2008, pp. 1188-1189
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Variation of Rutherford Backscattered Ion and Ion-induced Secondary Electron Yield with Atomic Number in the “Orion” Scanning Helium Ion Microscope
BJ Griffin, D Joy
Published online by Cambridge University Press:

03 August 2008, pp. 1190-1191
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Study of Helium ion induced Secondary Electron Emission
R Ramachandra, BJ Griffin, D Joy
Published online by Cambridge University Press:

03 August 2008, pp. 1192-1193
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films
C Trager-Cowan, F Sweeney, PR Edwards, FL Dynowski, AJ Wilkinson, A Winkelmann, AP Day, T Wang, PJ Parbrook, IM Watson, DC Joy
Published online by Cambridge University Press:

03 August 2008, pp. 1194-1195
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron Beam Induced Processing: Experimentation, Simulation, and Applications
JD Fowlkes, DA Smith, PD Rack
Published online by Cambridge University Press:

03 August 2008, pp. 1196-1197
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Imaging in the SEM with X-Rays?
R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1198-1199
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

In Situ Imaging of Hydrated Specimens at Room Temperature in ESEM
J Chen, WAJ Neijssen, DJ Stokes, M Uncovsky
Published online by Cambridge University Press:

03 August 2008, pp. 1200-1201
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Determination of the Estimated Resolution of SEM Images
C Probst, H Demers, R Gauvin
Published online by Cambridge University Press:

03 August 2008, pp. 1202-1203
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Microscopic Characterization of Agave Tequilana Weber var. Azul Fibers from Agroindustrial Waste in Activated Carbon Production
L Ballinas, L Manjarrez, V Fierro, A Celzard, A Gonçalves, G Moraes-Rocha, G González-Sánchez
Published online by Cambridge University Press:

03 August 2008, pp. 1204-1205
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Study of Microscopic Structure of Cellulose and Lignin Based Membranes
L Ballinas, L Manjarrez, MA Hermosillo, R Valdez, A Gonçalves, G Moraes-Rocha, G González-Sánchez
Published online by Cambridge University Press:

03 August 2008, pp. 1206-1207
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Beam skirting effects on energy deposition profile in VP-SEM
BD Myers, Z Pan, VP Dravid
Published online by Cambridge University Press:

03 August 2008, pp. 1208-1209
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Automated Image Acquisition at High Spatial Resolutions in a Field Emission Gun Scanning Electron Microscope
J Blackson, CS Todd, G Bar, D Reuschle, M Janus, M Darus, A Nickles
Published online by Cambridge University Press:

03 August 2008, pp. 1210-1211
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Comparison of Backscatter Electron, R-filter, and Scanning Transmission Imaging of Sectioned Resin Embedded Biological Materials in Field Emission Scanning Electron Microscope
N Erdman, CH Nielsen, CA Ackerley
Published online by Cambridge University Press:

03 August 2008, pp. 1212-1213
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Design and Development of an Ultra-High Vacuum Variable-Pressure Scanning Electron Microscope for Dynamical Studies of Nanostructures
M Klein, S Kodambaka, P Marienhoff
Published online by Cambridge University Press:

03 August 2008, pp. 1214-1215
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Surface Interactions and Phase Transformations During the Synthesis of Ni Nanoparticles on a Mica Support
S Chenna, PA Crozier
Published online by Cambridge University Press:

03 August 2008, pp. 1216-1217
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Advances in Low and Ultra-Low Energy, High-Resolution SEM
L Roussel, DJ Stokes, RJ Young, I Gestmann
Published online by Cambridge University Press:

03 August 2008, pp. 1218-1219
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

A Study of low or ultra-low voltage SEM imaging for mesoporous materials
S Takeuchi, A Miyaki, H Ito, T Sawahata, M Nakagawa, S Kataoka, Y Inagi, A Endo
Published online by Cambridge University Press:

03 August 2008, pp. 1220-1221
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Production and Measurement of Sputtered Iridium
P Savage, J Mansfield
Published online by Cambridge University Press:

03 August 2008, pp. 1222-1223
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Recent Applications Development with the Helium Ion Microscope
L Scipioni
Published online by Cambridge University Press:

03 August 2008, pp. 1224-1225
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Page 38 of 48

Microscopy and Microanalysis

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Volume 14 - August 2008

21st Century Scanning Microscopy - Electrons and He Ions

Research Article

He Ion Induced Secondary Electron and Backscattered Electron Images Compared Side-by-side With Electron Beam Induced Secondary Electron, Backscattered, and Transmission Electron Images

Relative Contrast in Ion and Electron Induced Secondary Electron Images

Variation of Rutherford Backscattered Ion and Ion-induced Secondary Electron Yield with Atomic Number in the “Orion” Scanning Helium Ion Microscope

A Study of Helium ion induced Secondary Electron Emission

Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films

Electron Beam Induced Processing: Experimentation, Simulation, and Applications

Imaging in the SEM with X-Rays?

In Situ Imaging of Hydrated Specimens at Room Temperature in ESEM

Determination of the Estimated Resolution of SEM Images

Microscopic Characterization of Agave Tequilana Weber var. Azul Fibers from Agroindustrial Waste in Activated Carbon Production

Study of Microscopic Structure of Cellulose and Lignin Based Membranes

Beam skirting effects on energy deposition profile in VP-SEM

Automated Image Acquisition at High Spatial Resolutions in a Field Emission Gun Scanning Electron Microscope

A Comparison of Backscatter Electron, R-filter, and Scanning Transmission Imaging of Sectioned Resin Embedded Biological Materials in Field Emission Scanning Electron Microscope

Design and Development of an Ultra-High Vacuum Variable-Pressure Scanning Electron Microscope for Dynamical Studies of Nanostructures

Surface Interactions and Phase Transformations During the Synthesis of Ni Nanoparticles on a Mica Support

Advances in Low and Ultra-Low Energy, High-Resolution SEM

A Study of low or ultra-low voltage SEM imaging for mesoporous materials

Production and Measurement of Sputtered Iridium

Recent Applications Development with the Helium Ion Microscope

Microscopy and Microanalysis

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Volume 14 - August 2008

21st Century Scanning Microscopy - Electrons and He Ions

Research Article