Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
GFIS in Semiconductor Applications
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 156-157
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- Cited by 2
3D Virtual Histology of Polychaetes Using Micro-CT
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 644-645
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- Cited by 2
A Compact High Solid Angle EDX Detector System for SEM and TEM
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- Published online by Cambridge University Press:
- 04 August 2017, pp. 76-77
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- Cited by 2
Characterization of Defects in III-V Semiconductor Materials (InP, GaAs and InGaAs/ InP on Si) in Nano-sized Patterns by Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 1540-1541
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- Cited by 2
XPS Study of Corrosion Deposit in Stainless Steel Hardfacing
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 1086-1087
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Determination of Triclinic Bravais Lattice by Means of EBSD Pattern
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 670-671
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- Cited by 2
Measuring Trace Level Constituents with SEM/SDD-EDS
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- Published online by Cambridge University Press:
- 26 July 2009, pp. 6-7
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Alterations in the Molecular Interaction of Bcl-2 and Bax During Apoptosis Assessed Using Fluroescence Resonance Energy Transfer (FRET) Microscopy and Green Fluorescent Protein (GFP)-Bax and Blue Fluorescent Protein (BFP)-Bcl-2 Expressing Proteins
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- Published online by Cambridge University Press:
- 02 July 2020, pp. 135-136
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Low-kV SEM Imaging of Epitaxial Graphene Grown on Various Substrates
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 18-19
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Time-Resolved Electron Holography by Interference Gating
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- 01 August 2018, pp. 1874-1875
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Learning Phase Retrieval with Backpropagation
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- 05 August 2019, pp. 62-63
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Synthesis of Mesoporous Zirconia by Using CTAB as Template
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- 23 September 2015, pp. 1781-1782
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Structure of TiN/CrN Interface in Nanolaminate Coatings with Enhanced Mechanical and Tribological Properties
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 2278-2279
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Application of Electron Tomography for Semiconductor Device Analysis
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- 31 July 2006, pp. 1552-1553
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Probing Nanoparticle Dynamics in 200 nm Thick Liquid Layers at Millisecond Time Resolution
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- 23 September 2015, pp. 267-268
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Mössbauer Spectroscopy and Transmission Electron Microscopy Analysis of Transition Carbides in Quenched and Partitioned Steel
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- 23 September 2015, pp. 2271-2272
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In Situ Electron Holography and EELS of Hetero-Interfaces in Solid Oxide Fuel Cells
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- Published online by Cambridge University Press:
- 23 November 2012, pp. 1292-1293
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Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis
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- 22 July 2022, pp. 2200-2201
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Failure Analysis of Conformal Cooling Inserts Fabricated by Additive Manufacturing
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- 22 July 2022, pp. 2818-2820
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Sparse Scanning Electron Microscopy and Deep Learning for Imaging and Segmentation of Neuron Structures
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- 05 August 2019, pp. 196-197
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