Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 7
High Resolution, High Throughput Electron Tomography Reconstruction
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- Published online by Cambridge University Press:
- 01 August 2005, pp. 312-313
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- Cited by 7
Direct Comparison of X-ray Detector Solid Angles in Analytical Electron Microscopes
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 1262-1263
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- Cited by 7
Restoration of Uneven Illumination in Light Sheet Microscopy Images
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- Published online by Cambridge University Press:
- 20 June 2011, pp. 607-613
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- Cited by 7
Electron Energy Loss Spectroscopy Characterization of TANOS (TaN/Al2O3/Si3N4/SiO2/Si) Stacks
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- Published online by Cambridge University Press:
- 06 August 2013, pp. 109-113
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- Cited by 7
Deep Learning as a Tool for Image Denoising and Drift Correction
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- Published online by Cambridge University Press:
- 05 August 2019, pp. 190-191
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- Cited by 7
X-ray Phase Contrast Imaging Technique Using Bilens Interferometer.
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 162-163
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- Cited by 7
Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms
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- Published online by Cambridge University Press:
- 12 December 2011, pp. 212-217
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- Cited by 7
Machine Learning-based Crystal Structure Prediction for X-Ray Microdiffraction
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- Published online by Cambridge University Press:
- 10 August 2018, pp. 142-143
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- Cited by 7
The Prospect of Three-Dimensional Induction Mapping Inside Magnetic Nanostructures by Combining Electron Holography with Electron Tomography
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- Published online by Cambridge University Press:
- 01 August 2004, pp. 1010-1011
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- Cited by 7
Focused Ion Beam Preparation of Low Melting Point Metals: Lessons Learned From Indium
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- Published online by Cambridge University Press:
- 22 March 2022, pp. 603-610
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- Cited by 7
High-Temperature In Situ Straining Experiments in the High-Voltage Electron Microscope
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- Published online by Cambridge University Press:
- 28 July 2005, pp. 226-234
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- Cited by 7
Observation of an Electron Vortex Beam Created from a Self-Charging Rod
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- 25 July 2016, pp. 1710-1711
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- Cited by 7
Imaging Shape-Dependent Corrosion Behavior of Pt Nanoparticles over Extended Time Using a Liquid Flow Cell and TEM
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- Published online by Cambridge University Press:
- 27 August 2014, pp. 1508-1509
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- Cited by 7
K3 - A First Look at The New Direct Electron Detection Camera from Gatan Company
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- Published online by Cambridge University Press:
- 01 August 2018, pp. 890-891
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- Cited by 7
Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 614-615
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- Cited by 7
The Diamond I13-2 Transmission X-ray Microscope: Current Status and Future Developments
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- 10 August 2018, pp. 216-217
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- Cited by 7
Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy
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- Published online by Cambridge University Press:
- 01 August 2010, pp. 66-67
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- Cited by 7
Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution
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- Published online by Cambridge University Press:
- 09 October 2013, pp. 1258-1259
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- Cited by 7
Impact of 40 Years of Technology Advances on EDS System Performance
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- Published online by Cambridge University Press:
- 06 October 2009, pp. 484-490
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- Cited by 7
Misalignment Induced Artifacts in Quantitative Annular Bright-Field Imaging
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- Published online by Cambridge University Press:
- 25 July 2016, pp. 888-889
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