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X-ray Phase Contrast Imaging Technique Using Bilens Interferometer.

Published online by Cambridge University Press:  10 August 2018

D. Zverev ,
I. Snigireva ,
V. Kohn ,
S. Kuznetsov ,
V. Yunkin  and
A. Snigirev
D. Zverev
Affiliation:
Immanuel Kant Baltic Federal University, Kaliningrad, Russia
I. Snigireva*
Affiliation:
European Synchrotron Radiation Facility, Grenoble, France
V. Kohn
Affiliation:
Russian Research Centre "Kurchatov Institute", Moscow, Russia
S. Kuznetsov
Affiliation:
Institute of Microelectronics Technology RAS, Chernogolovka, Russia
V. Yunkin
Affiliation:
Institute of Microelectronics Technology RAS, Chernogolovka, Russia
A. Snigirev
Affiliation:
Immanuel Kant Baltic Federal University, Kaliningrad, Russia
*
*irina@esrf.fr

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 162 - 163
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Momose, A., et al., Japanese journal of Applied Physics 42 2003 L866.CrossRefGoogle Scholar
[2] David, C., et al, Appl. Phys. Lett. 81 2002 3287.CrossRefGoogle Scholar
[3] Snigirev, A., et al, Phys. Rev. Lett. 103 2009 064801.CrossRefGoogle Scholar
[4] Snigirev, A., et al, Optics express 22 2014 25842–25852.Google Scholar
[5] The authors acknowledge funding from the Ministry of Education and Science of the Russian Federation grant contract JV° 14.Y26.31.0002..Google Scholar