Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Griffin, Brendan J.
2011.
A comparison of conventional Everhart‐Thornley style and in‐lens secondary electron detectors—a further variable in scanning electron microscopy.
Scanning,
Vol. 33,
Issue. 3,
p.
162.
Muray, Lawrence P.
2011.
Developments in low‐voltage microscopy instrumentation.
Scanning,
Vol. 33,
Issue. 3,
p.
155.
Hamacher-Barth, E.
Jansson, K.
and
Leck, C.
2013.
A method for sizing submicrometer particles in air collected on Formvar films and imaged by scanning electron microscope.
Atmospheric Measurement Techniques,
Vol. 6,
Issue. 12,
p.
3459.
Kazmiruk, V. V.
Kurganov, I. G.
and
Savitskaya, T. N.
2014.
Modifying a low-voltage electron probe system.
Bulletin of the Russian Academy of Sciences: Physics,
Vol. 78,
Issue. 9,
p.
821.
Bhuiyan, Iftekhar U.
Mouzon, Johanne
Schröppel, Birgit
Kaech, Andres
Dobryden, Illia
Forsmo, Seija P.E.
and
Hedlund, Jonas
2014.
Microstructure of Bentonite in Iron Ore Green Pellets.
Microscopy and Microanalysis,
Vol. 20,
Issue. 1,
p.
33.
Hamacher-Barth, Evelyne
Leck, Caroline
and
Jansson, Kjell
2016.
Size-resolved morphological properties of the high Arctic summer aerosol during ASCOS-2008.
Atmospheric Chemistry and Physics,
Vol. 16,
Issue. 10,
p.
6577.
Griffin, Brendan J
2023.
Secondary Electron Imaging, Variable Pressure (ESEM), Helium Ion Microscopy and Kangaroos - My Perspective of David Joy!.
Microscopy and Microanalysis,
Vol. 29,
Issue. Supplement_1,
p.
450.