Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

M Watanabe; E Okunishi; T Aoki

doi:10.1017/S1431927610057764

Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press: 01 August 2010

M Watanabe ,

E Okunishi and

T Aoki

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M Watanabe: Affiliation:
Lehigh University
E Okunishi: Affiliation:
JEOL Ltd
T Aoki: Affiliation:
JEOL USA

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 66 - 67

DOI: https://doi.org/10.1017/S1431927610057764 [Opens in a new window]

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Atomic-level Chemical Analysis by EELS and XEDS in Aberration- corrected Scanning Transmission Electron Microscopy

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