Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Lensless Imaging of Nano- and Meso-Scale Dynamics with X-rays

High-Resolution Phase-Contrast Imaging at XFELs

Fast Solid State Electron Detectors Based on the Principle of Silicon Drift Detectors for Efficient Soft and Hard Matter Analysis

A06 Advanced Analytical TEM/STEM

Abstract

Analytical Electron Tomography: Methods and Applications

Multi-Dimensional Machine Learning Aided Analysis of a Nickel-Based Superalloy

Off-axis chromatic scanning confocal electron microscopy for inelastic imaging with atomic resolution

Depth Sensitivity of Atomic Resolution Aberration-Corrected Through-Focus STEM Imaging of Bi Dopants on Cu Grain Boundaries

Super-X XEDS STEM Tomography of y' Precipitates in the LSHR Nickel Superalloy

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Nanoscale Mechanical Scattering Experiments towards the Local Analysis of Thermal Active Modes and Dispersion Interactions at Interfaces

High-Resolution Mapping of Quantitative Elastic Modulus of Polymers

Environmental AFM as a Probe of the Morphology, Viscoelasticity and Lubricity of Crosslinked Hydrophilic Biomedical Coatings

A New variable temperature solution-solid interface scanning tunneling microscope

The power of confocal raman-AFM and raman-SEM (RISE) imaging in polymer research

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Dedicated X-Ray mapping system with single and multiple SDD detectors for quantitative X-Ray mapping and data processing

Quantitative Elemental Mapping with Electron Microprobe and Automated Data Analysis

Homogeneity Testing of Microanalytical Reference Materials by Electron Probe Microanalysis

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design

Probing Complex Nanostructures by Combining Atomic-Scale Theory and Scanning Transmission Electron Microscopy

Integrated Computational and Experimental Structure Determination for Nanoparticles

Local Crystallography: Phases, Symmetries, and Defects from Bottom Up

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract