Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Pattern Overlap and High Resolution Electron Backscatter Diffraction

Electron and X-ray Diffraction Measurements of Elastic Stress and Plastic Strain from Ultrasonic Impact Treatment of Aluminum-Magnesium Alloys

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Pushing the Limits of Cathodoluminescence Signal Detection: Analyzing 2D Materials

SPARC: a Cathodoluminescence Platform for Nanoscale Plasmonics in a Scanning Electron Microscope

Measuring Gas Adsorption on Individual Facets of a Nanoparticle by a Surface Plasmon Nanoprobe

Evaluating Adhesion Layers for Plasmonic Nanostructures with Monochromated STEM-EELS and Surface Enhanced Raman Spectroscopy

Unconventional Surface Plasmon Excitations in Bi2Se3

A15 Imaging Mass Spectrometry

Abstract

Imaging Mass Spectrometry Using Ultra-high Mass Resolution Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer, SpiralTOF

MALDI and LDI Imaging of Forensic Samples by Using A Spiral-Trajectory Ion Optics Time-of-Flight Mass Spectrometer

Synthesis of Monolayer Molybdenum Disulfide and ToF-SIMS Characterization

An Investigation of the Pancreatic Islet Tumor Microenvironment with Time-of-Flight Secondary Ion Mass Spectrometry

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract

Manganese Segregation at Antiphase Boundaries Connecting ZrO2 Pillars in ZrOi-Lai/sSri/sMnOs Pillar-Matrix Structures

Atomic-Resolution EELS Study of Titanium Dopant Effects of Ca3Co4O9 Thin Film

Atomic-Scale Quantitative and Analytical STEM Investigation of Sr-δ-Doped La2CuO4 Multilayers

Electronic Structure of New Line Defect in Strained NdTiCb on SrTiO3

Characterization of Ultra Low-K Dielectric Materials by STEM EELS Elemental Mapping

Investigation of Co-Doped BaTiO3 by Atomic-Resolution EELS

Study on the Atomic and Electronic Structure in CrN (VN, TiN) Films using CS-Corrected TEM

Quantitative Determination of Chemical Composition of Multinary III/V Semiconductors With Sublattice Resolution Using Aberration Corrected HAADF-STEM

Determination of Local Chemistry Composition of Low-Dimensional Semiconductor Nanostructures Through the use of High-Resolution HAADF images

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

A15 Imaging Mass Spectrometry

Abstract

Physical Science Symposia

P02 Materials Problem Solving with Aberration-Corrected EM

Abstract