Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Controlled Radiolytic Synthesis in the Fluid Stage. Towards Understanding the Effect of the Electron Beam in Liquids

Development of Quantitative STEM for a Conventional S/TEM and Real-Time Current Calibration for Performing QSTEM with a Cold Field Emission Gun

High-Speed Analysis of Pt Based Alloys at High Spatial Resolution using EELS

Verifying the Structure and Composition of Prepared Porous Catalytic Supports

A Correlative Study of HRTEM, HAADF-STEM, and STEM-EELS Spectrum Imaging for Biphasic Electrochemically Active TiO2

Interface Sharpness in Amorphous Multilayer Heterostructures and their Effect on Quantum Confinement

Influence of Device Microstructure on The Optical Properties of Ge1-ySny (y=00.11) LEDs Produced by Next Generation Deposition Methods

Inter-Diffusion Characterization of SnOx/CuOx Grown on Cu Foil

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Zernike Phase Contrast Electron Microscopy: Observation of the Image Formation and Improvement of the Image Quality using Direct Detector

Zernike Phase Plate Configuration at Intermediate Lens Position on JEM2200FS

Zernike Cryo-EM with a Direct Electron Camera Enables Tracking Protein Conformations in the Temporal Dimension

A03 Electron Holography for Nanofields in Solids

Abstract

Off-Axis Electron Holography for the Quantitative Study of Magnetic Properties of Nanostructures: From the Single Nanomagnet to the Complex Device

Three-Dimensional Magnetic Vortex Cores Visualized by Electron Holographic Vector Field Tomography

Towards Multiresolution Phase Retrieval using Electron Ptychography

Skyrmion Lattices Observed by High-Voltage Holography Electron Microscopes

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

Roles of self-assembly and beam damage in gas-assisted electron and ion beam induced processing

Site-Specific TEM Specimen Preparation of Samples with Sub-Surface Features

Micro-micromechanical Properties of Weld Metal

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

Ultrafast Infrared Nanoscopy with Sub-Cycle Temporal Resolution

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P11 Advances in Transmission Electron Microscopy and Spectroscopy of Energy Related Materials

Abstract

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

A03 Electron Holography for Nanofields in Solids

Abstract

A04 Advances in FIB: New Instrumentation and Applications in Materials and Biological Sciences

Abstract

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract