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Depth Sensitivity of Atomic Resolution Aberration-Corrected Through-Focus STEM Imaging of Bi Dopants on Cu Grain Boundaries
Published online by Cambridge University Press: 23 September 2015
Abstract
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2177 - 2178
- Copyright
- Copyright © Microscopy Society of America 2015