Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

Rapid 3D Reconstruction in the EDS Tomography by using Iterative Series Reduction (ISER) Method

Moving atomic-resolution imaging into the age of deep data

High-accuracy electron tomography of semiconductor devices

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

Progress in Crystallographic Image Processing for Scanning Probe Microscopy

Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films on Magnetic Recording Heads

Characterization of Nanocarrier Complexes with Plasmid DNA using SEM, TEM and AFM

Custom Modification of AFM Tips for Fast, High Force Resolution Single-Molecule Force Spectroscopy

Comparison of Magnetic Domain Observation by Means of Magnetic Force Mi-croscopy and Lorentz Transmission Electron Microscopy

Use of the Unroofing Technique for AFM Direct Imaging of the Intra-Cellular Structure at High Resolution

Lateral Force Microscopy using Nanomanipulation

Correlated Atomic Force Microscopy and Single Molecule Localization Microscopy

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Pushing the Limits on SEM Quantification - Combined Quantification with SDD and Fully Focussing WD detectors

Factors Affecting WDS Performance Superiority over EDS

Enhanced Theoretical Model for Avoiding Mistakes in SEM-EDS Analysis

Quantitative Analysis of Heterogenous Samples by SEM/EDS

Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM

Characterization and Comparison of Detector Systems for Large Area X-ray Imaging

Accurate EPMA Quantification of the First Series Transition Metals using Ll Lines

Multilayer Thin Films as Pseudo-Homogeneous EDX Standards

A Method of Component Extraction of EDS and EELS maps

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A06 Advanced Analytical TEM/STEM

Abstract

A07 Scanning Probe Microscopy: New Methods and Applications

Abstract

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract