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Conductive Atomic Force Microscopy Characterization of Ultra-Thin Diamond-Like Carbon Films on Magnetic Recording Heads

Published online by Cambridge University Press:  23 September 2015

Shirley Mejia ,
Sean P. Leary ,
Guilherme P. Souza  and
Kurt C. Ruthe
Shirley Mejia
Affiliation:
Western Digital Corporation, Magnetic Heads Operations, Metrology & Materials Characterization, Ayutthaya, Thailand, 13160
Sean P. Leary
Affiliation:
Western Digital Corporation, Magnetic Heads Operations, Metrology & Materials Characterization, Ayutthaya, Thailand, 13160
Guilherme P. Souza
Affiliation:
Western Digital Corporation, Magnetic Heads Operations, Metrology & Materials Characterization, Ayutthaya, Thailand, 13160
Kurt C. Ruthe
Affiliation:
Western Digital Corporation, Magnetic Heads Operations, Metrology & Materials Characterization, Ayutthaya, Thailand, 13160

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1613 - 1614
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[2] Herrera-Gomez, A et al Surf. Interface Anal. 39 2007 p 904 Google Scholar
[4] Robertson, J Mater. Sci. Eng. R37 2002 p 129 CrossRefGoogle Scholar