Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Technologist Forum, Tutorials and Outreach Symposia

X30 Technologists’ Forum: Emerging New Specialized Techniques for Correlative Microscopy

Abstract

Cryo-Correlative Light and Electron Microscopy (Cryo-CLEM): Specimen Workflow Paths and Recent Instrument Developments

Correlative Array Tomography - from 2D towards 3D

Micro Computed Tomographic X-ray Imaging (Micro CT): A Versatile and Non-Destructive Method for Biological Specimens

X43 Bio Tutorial - Advances in Light Sheet Microscopy

Abstract

Optimization of the Excitation Light Sheet in Selective Plane Illumination Microscopy

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

Development of Amorphous Carbon Thin Film Phase Plate

Thin-Film-Based Phase Plates for Transmission Electron Microscopy Fabricated From Metallic Glasses

Optimization of JEM2200FS for Zernike Phase Contrast Cryo-EM

Initial Experience with the Volta Phase Plate

High-Resolution Transmission Electron Microscopy With Zach Phase Plate

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

TEM Video Compressive Sensing

Imaging At the Timescale Of Micro- and Milliseconds With the pnCCD (S)TEM Camera

NO2 Hydrogenation over Pt and Rh Catalysts: a Study at The Atomic Level by Field Emission Microscopy

Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime

Characterization of Laser Ablation Dynamics for Nickel Thin Films on Silicon Using Movie Mode Dynamic TEM

A06 Advanced Analytical TEM/STEM

Abstract

New Approach to Analysis of Noisy EELS Data

Use of a hybrid silicon pixel (Medipix) detector as a STEM detector

Development of an Aberration Corrected 1.2-MV Field Emission Transmission Electron Microscope

Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages

Ettention: Building Blocks for Iterative Reconstruction Algorithms

Analysis of TEM tomography artifacts with experiments on model specimens

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Technologist Forum, Tutorials and Outreach Symposia

X30 Technologists’ Forum: Emerging New Specialized Techniques for Correlative Microscopy

Abstract

X43 Bio Tutorial - Advances in Light Sheet Microscopy

Abstract

Analytical and Instrumentation Science Symposia

A02 TEM Phase Contrast Imaging

Abstract

A05 Fast and Ultrafast Imaging with Electrons and Photons

Abstract

A06 Advanced Analytical TEM/STEM

Abstract