Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

Windowless, Silicon Nitride window and Polymer window EDS detectors: Changes in Sensitivity and Detectable Limits

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

Transmission Electron Microscopic and First-principles Study of SrTiO3/GaAs Hetero-interfaces

Observation of Skyrmions at Room-temperature in Amorphous Fe/Gd Films

A Biomimetic-Computational Approach to Optimizing the Quantum Efficiency of Photovoltaics

Combine Simulation and Experiment EELS to Characterize Ionomer Conformation

Investigation of the Structural and Electronic Properties of Pt/γ-Al2O3, a Model Catalyst System

Analysis of Surface Structures in Ru Nanocatalysts

Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structural Refinement Based on Fluctuation Microscopy

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

Orientation Mapping by Precession Transmission Electron Microscopy

Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope

The Presence of Higher-Order Laue Zone Intensities and the Relrod Effect in Cubic Metals in the Transmission Electron Microscope

Semi-Automated DigitalMicrograph Routine for Real-Time Phase Identification

Improving Spatial Detection of Twins Achieved by Measuring Individual Kikuchi Band Intensity in EBSD Patterns

Transmission Electron Backscatter Diffraction (tEBSD) analysis of Au Thin Films

Automated Image Alignment and Distortion Removal for 3-D Serial Sectioning with Electron Backscatter Diffraction

Growth and Characterization of (110) InAs Quantum Well Heterostructures by Transmission Electron Microscopy and Electron Channeling Contrast Imaging

Techniques for Transmission EBSD Mapping of Atom Probe Specimens

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract

Characterization of Sulfonated Polysulfone Polymers by EELS

Structural and Optical Properties of AlGaN MQWs Grown by MOCVD Using One and Two TMG Sources

Probing Plasmons in Three Dimensions within Random Morphology Nanostructures

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Analytical and Instrumentation Science Symposia

A08 Advances in Qualitative and Quantitative X-ray Microanalysis: From Detectors to Techniques

Abstract

A09 Advances in Combining Simulation and Experiment for Materials Design

Abstract

A10 Advances in Electron Diffraction and Automated Mapping Techniques

Abstract

A14 Surface Plasmons, Cathodoluminescence, and Low-Loss EELS

Abstract