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Analysis of TEM tomography artifacts with experiments on model specimens

Published online by Cambridge University Press:  23 September 2015

Jonathan Winterstein ,
Joshua Schumacher  and
J. Alexander Liddle
Jonathan Winterstein
Affiliation:
NIST Center for Nanoscale Science and Technology, Gaithersburg, MD 20899
Joshua Schumacher
Affiliation:
NIST Center for Nanoscale Science and Technology, Gaithersburg, MD 20899
J. Alexander Liddle
Affiliation:
NIST Center for Nanoscale Science and Technology, Gaithersburg, MD 20899

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1603 - 1604
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Venkatakrishnan, SV, Drummy, LF, Jackson, MA, De Graef, M, Simmons, J & Bouman, CA, IEEE Transactions on Image Processing 22 (2013), p. 4532.Google Scholar