Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 28 of 40

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Using an Environmental Scanning Electron Microscope to Study Phase Transitions and Chemistries of NaCl/Glutaric Acid Aerosol Particles
R L Schalek, Hui-Ming Hung, S T Martin
Published online by Cambridge University Press:

01 August 2004, pp. 1068-1069
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Dynamic Phase Transitions and Domain Formations in Electronic Materials by Environmental Scanning Electron Microscopy
Harald Dobberstein
Published online by Cambridge University Press:

01 August 2004, pp. 1070-1071
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Observation of Ferroelectric Domains using Environmental SEM
Wenwu Cao
Published online by Cambridge University Press:

01 August 2004, pp. 1072-1073
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Raising the Pressure: Realizing Room Temperature/High Humidity Applications in ESEM
Debbie J Stokes, Francis S Baker, Milos Toth
Published online by Cambridge University Press:

01 August 2004, pp. 1074-1075
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Method for In-situ Mechanical Testing Inside an Environmental SEM Chamber
Nadja Zakowsky, Athene M. Donald, Frank S. Baker
Published online by Cambridge University Press:

01 August 2004, pp. 1076-1077
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Charge Contrast Imaging of the Soft Tissue and Mineralized Skeletal Phases in a Scleractinian Coral
Peta L Clode, Brendan J Griffin
Published online by Cambridge University Press:

01 August 2004, pp. 1078-1079
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

High-Resolution Atomic Force Microscopy of Organic Materials
Sergei Magonov
Published online by Cambridge University Press:

01 August 2004, pp. 1080-1081
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of Molecular QCA Cells by Q-Controlled Enhanced Amplitude Modulation Atomic Force Microscopy
Ida Lee, V. Sarveswaran, M. Lieberman, E. Greenbaum
Published online by Cambridge University Press:

01 August 2004, pp. 1082-1083
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Morphology/Mechanical Property Correlations in Multiphase Polyolefin Blends: An Atomic Force Microscopy Study
Francis M Mirabella
Published online by Cambridge University Press:

01 August 2004, pp. 1084-1085
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Nanomechanical Properties of Surfaces and Interfaces of Polycarbonate Systems
J Juliani , Dehua Yang, T.J. Wyrobek
Published online by Cambridge University Press:

01 August 2004, pp. 1086-1087
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Artifacts in the Measurements of Surface Mechanical Properties
Mark R VanLandingham
Published online by Cambridge University Press:

01 August 2004, pp. 1088-1089
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

More Than a Surface Probe: Investigation of Subsurface Charging in Buried Oxide Layers in Silicon Using Kelvin Probe Microscopy
Marion A. Stevens-Kalceff
Published online by Cambridge University Press:

01 August 2004, pp. 1090-1091
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Forces in Biology and Atomic Force Microscopy (AFM) Imaging: Pull and See This!
Irene Revenko, Roger Proksch, Deron Walters
Published online by Cambridge University Press:

01 August 2004, pp. 1092-1093
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Atomic Force Microscopy (AFM) Imaging and Force Recognition at the Molecular Level in Bacteria
David P. Allison, Claretta J. Sullivan , Jennifer L. Morrell, Peter R. Hoyt, Mitchel J. Doktycz
Published online by Cambridge University Press:

01 August 2004, pp. 1094-1095
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Single Molecule Mechanical Testing of Mimetic-Elastin Molecules
Jaimie R. Anderson, Vincent P. Conticello, Lawrence A. Bottomley
Published online by Cambridge University Press:

01 August 2004, pp. 1096-1097
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In Situ Observation of Freeze Fractured Red Blood Cells with a High-Vacuum Low-Temperature Atomic Force Microscope
Charles B Mooney, Keiichi Nakamoto, Shin-ichi Kitamura
Published online by Cambridge University Press:

01 August 2004, pp. 1098-1099
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

NSOM: Current Technology, Instrumentation and Applications
Klaus Weishaupt, Olaf Hollricher
Published online by Cambridge University Press:

01 August 2004, pp. 1100-1101
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)
Guangchun Cui, Rosario A Gerhardt
Published online by Cambridge University Press:

01 August 2004, pp. 1102-1103
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Development of an Integrated Near-Field Acoustic Holography (NFAH) System on a Scanning Probe Microscopy Platform
Gajendra Shekhawat, Vinayak P Dravid
Published online by Cambridge University Press:

01 August 2004, pp. 1104-1105
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Wide Area Scanning Atomic Force Profiler
A D Batchelor, Brian Galhouse, Dieter P Griffis, Fred A Stevie, Phillip E Russell
Published online by Cambridge University Press:

01 August 2004, pp. 1106-1107
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 28 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Using an Environmental Scanning Electron Microscope to Study Phase Transitions and Chemistries of NaCl/Glutaric Acid Aerosol Particles

Observation of Dynamic Phase Transitions and Domain Formations in Electronic Materials by Environmental Scanning Electron Microscopy

Observation of Ferroelectric Domains using Environmental SEM

Raising the Pressure: Realizing Room Temperature/High Humidity Applications in ESEM

A Method for In-situ Mechanical Testing Inside an Environmental SEM Chamber

Charge Contrast Imaging of the Soft Tissue and Mineralized Skeletal Phases in a Scleractinian Coral

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article

High-Resolution Atomic Force Microscopy of Organic Materials

Characterization of Molecular QCA Cells by Q-Controlled Enhanced Amplitude Modulation Atomic Force Microscopy

Morphology/Mechanical Property Correlations in Multiphase Polyolefin Blends: An Atomic Force Microscopy Study

Nanomechanical Properties of Surfaces and Interfaces of Polycarbonate Systems

Artifacts in the Measurements of Surface Mechanical Properties

More Than a Surface Probe: Investigation of Subsurface Charging in Buried Oxide Layers in Silicon Using Kelvin Probe Microscopy

Forces in Biology and Atomic Force Microscopy (AFM) Imaging: Pull and See This!

Atomic Force Microscopy (AFM) Imaging and Force Recognition at the Molecular Level in Bacteria

Single Molecule Mechanical Testing of Mimetic-Elastin Molecules

In Situ Observation of Freeze Fractured Red Blood Cells with a High-Vacuum Low-Temperature Atomic Force Microscope

NSOM: Current Technology, Instrumentation and Applications

Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)

Development of an Integrated Near-Field Acoustic Holography (NFAH) System on a Scanning Probe Microscopy Platform

A Wide Area Scanning Atomic Force Profiler

Microscopy and Microanalysis

Refine listing

Actions for selected content:

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Volume 10 - Issue S02 - August 2004

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Scanned Probe Microscopy: Probing Surfaces at the Nanoscale

Research Article