Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 30 of 40

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

TEM Annular Objective Apertures Fabricated by FIB
Sara Bals, Velimir R Radmilovic, Christian Kisielowski
Published online by Cambridge University Press:

01 August 2004, pp. 1148-1149
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Site-Specific FIB Preparation of Atom Probe Samples
Hendrik O. Colijn, Thomas F. Kelly, R. M. Ulfig, Rudolf G. Buchheit
Published online by Cambridge University Press:

01 August 2004, pp. 1150-1151
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Application of the CrossBeam Technology to TEM Sample Preparation and Nanolithography
Peter Gnauck, Ulrike Zeile
Published online by Cambridge University Press:

01 August 2004, pp. 1152-1153
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning
Paul A Anzalone, John F Mansfield, Lucille A Giannuzzi
Published online by Cambridge University Press:

01 August 2004, pp. 1154-1155
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3D Microscopy and Microanalysis of Au-Al Ultrasonic Bonds by Specific Ion Beam Processing Steps and Scanning Electron Microscopy
Wolfgang Hauffe, Andrzej Bochenek, Marian Lukaszewicz, Enrico Langer, R. J. Mitro
Published online by Cambridge University Press:

01 August 2004, pp. 1156-1157
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Study of Surface Damage and Profile of a FIB-Prepared Si Sample
Shixin X Wang
Published online by Cambridge University Press:

01 August 2004, pp. 1158-1159
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

TEM Specimen Preparation of Thin Interfacial Coatings on Continuous Ceramic Fibers Using the Focused Ion Beam (FIB) Technique
Dorothy W. Coffey, Karren L. More, Tracie Brummett
Published online by Cambridge University Press:

01 August 2004, pp. 1160-1161
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Preparation of Large Area Site Specific Plan View TEM Samples by Combining Focused Ion Beam and Etching Techniques
A. Anciso, P.J. Jones, R.B. Irwin
Published online by Cambridge University Press:

01 August 2004, pp. 1162-1163
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Direct 3D (S)TEM Observation at Specific-site and High Resolution Using a FIB Micro-sampling Technique
Toshie Yaguchi, Mitsuru Konno, Takeo Kamino, Takahito Hashimoto, Tsuyoshi Ohnishi, Kaoru Umemura
Published online by Cambridge University Press:

01 August 2004, pp. 1164-1165
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy
Wolfgang Gruenewald, Hans-Juergen Engelmann, Beate Volkmann
Published online by Cambridge University Press:

01 August 2004, pp. 1166-1167
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Grafting the FIB Lift-out TEM Sample for Further Ion Milling
Nathan Wang, Jin Wu, Sabbas Daniel
Published online by Cambridge University Press:

01 August 2004, pp. 1168-1169
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Damage Caused by Transverse Scattering of Gallium during FIB Milling
Kil-Soo Ko, Won-Chae Jung, Jayhoon Chung, Lew Rabenberg
Published online by Cambridge University Press:

01 August 2004, pp. 1170-1171
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Tomographic Techniques in Biological and Physical Sciences

Research Article

3D Atomic Resolution Imaging through Aberration-Corrected STEM
Stephen J Pennycook, Andrew R Lupini, Albina Y Borisevich, Yiping Peng, Naoya Shibata
Published online by Cambridge University Press:

01 August 2004, pp. 1172-1173
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Holographic Tomography - Challenge and Opportunity
Heiner Friedrich, Molly R. McCartney, Peter R. Buseck
Published online by Cambridge University Press:

01 August 2004, pp. 1174-1175
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Tomography of Nano-Magnetic Materials Less Than 1 nm Resolution
Nobuo Tanaka, Akichika Ohno, Shunsuke Fukami, Jun Yamasaki
Published online by Cambridge University Press:

01 August 2004, pp. 1176-1177
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Application of FIB-Tomography to the Study of Microstructures in Titanium Alloys
R Williams, D Bhattacharyya, G B Viswanathan, R Banerjee, H L Fraser
Published online by Cambridge University Press:

01 August 2004, pp. 1178-1179
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Cryo X-ray Tomography of Whole Cells at 50 nm Resolution
Carolyn A Larabell, M. A. Le Gros
Published online by Cambridge University Press:

01 August 2004, pp. 1180-1181
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Mapping Cellular Elemental Distributions in Three Dimensions
Richard D. Leapman, Eva Kocsis, Guo Zhang, Thomas L. Talbot, Patrice Laquerriere
Published online by Cambridge University Press:

01 August 2004, pp. 1182-1183
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Electron Tomographic Studies of Bacterial Structure and Function
Kenneth H Downing, Haixin Sui, Luis R Comolli, Hoi-Ying Holman
Published online by Cambridge University Press:

01 August 2004, pp. 1184-1185
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Recent Advances in Cryoelectron Tomography of Frozen-hydrated Samples
Grant Jensen
Published online by Cambridge University Press:

01 August 2004, pp. 1186-1187
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 30 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

TEM Annular Objective Apertures Fabricated by FIB

Site-Specific FIB Preparation of Atom Probe Samples

Application of the CrossBeam Technology to TEM Sample Preparation and Nanolithography

DualBeam Milling and Deposition of Complex Structures Using Bitmap Files and Digital Patterning

3D Microscopy and Microanalysis of Au-Al Ultrasonic Bonds by Specific Ion Beam Processing Steps and Scanning Electron Microscopy

TEM Study of Surface Damage and Profile of a FIB-Prepared Si Sample

TEM Specimen Preparation of Thin Interfacial Coatings on Continuous Ceramic Fibers Using the Focused Ion Beam (FIB) Technique

Preparation of Large Area Site Specific Plan View TEM Samples by Combining Focused Ion Beam and Etching Techniques

Direct 3D (S)TEM Observation at Specific-site and High Resolution Using a FIB Micro-sampling Technique

Cleaning Treatment to Advance the Quality of FIB Samples for Transmission Electron Microscopy

Grafting the FIB Lift-out TEM Sample for Further Ion Milling

Damage Caused by Transverse Scattering of Gallium during FIB Milling

Tomographic Techniques in Biological and Physical Sciences

Research Article

3D Atomic Resolution Imaging through Aberration-Corrected STEM

Electron Holographic Tomography - Challenge and Opportunity

Electron Tomography of Nano-Magnetic Materials Less Than 1 nm Resolution

Application of FIB-Tomography to the Study of Microstructures in Titanium Alloys

Cryo X-ray Tomography of Whole Cells at 50 nm Resolution

Mapping Cellular Elemental Distributions in Three Dimensions

Electron Tomographic Studies of Bacterial Structure and Function

Recent Advances in Cryoelectron Tomography of Frozen-hydrated Samples

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Focused Ion Beam (FIB) / Dual Beam Applications and Techniques in Biological and Physical Sciences

Research Article

Tomographic Techniques in Biological and Physical Sciences

Research Article