Microscopy and Microanalysis: Volume 10 - Issue S02

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Volume 10 - Issue S02 - August 2004

Contents

Page 27 of 40

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Trace Element Imaging and Analysis in Biological Cells with Scanning X-ray Fluorescence Microscopy
Stefan Vogt, Joerg Maser, Tatjana Paunesku, Natasa Stojičevič, Barry Lai, Gayle E Woloschak
Published online by Cambridge University Press:

01 August 2004, pp. 1028-1029
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3D Elemental Mapping Using a Dedicated FIB/STEM System
Toshie Yaguchi, Mitsuru Konno, Takeo Kamino, Takahito Hashimoto, Tsuyoshi Ohnishi, Masashi Watanabe
Published online by Cambridge University Press:

01 August 2004, pp. 1030-1031
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

X-Ray Spectromicroscopy Studies in Environmental Sciences
J. Thieme, Claudia Schmidt, Peter Guttmann, J. Prietzel, Ingrid Kögel-Knabner
Published online by Cambridge University Press:

01 August 2004, pp. 1032-1033
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Simultaneous Amplitude and Phase Contrast Imaging with a Segmented Detector in Scanning Transmission X-ray Microscopy
Benjamin Hornberger, Chris Jacobsen, Michael Feser
Published online by Cambridge University Press:

01 August 2004, pp. 1034-1035
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

3-D X-ray Microscopy using a Laboratory Source
Michael Feser, Fred Duewer, Steve Wang, David Scott, Alan Lyon, Wenbing Yun
Published online by Cambridge University Press:

01 August 2004, pp. 1036-1037
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Application of Full-Field X-ray Diffraction Microscopy in Biological and Material Science
Yong S Chu, Andrei Tkachuk, Bary Lai, Zhengwei W Hu, Andreas Menzel, Hoydoo You
Published online by Cambridge University Press:

01 August 2004, pp. 1038-1039
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Improvements of Elemental Mapping via X-ray Spectrum Imaging Combined with Principal Component Analysis and Zero-Peak Deconvolution
M. Watanabe, D.B. Williams
Published online by Cambridge University Press:

01 August 2004, pp. 1040-1041
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Peak Shifts in the NIST Microcalorimeter X-ray Detector
Terrance Jach, John A Small, Dale E Newbury, Lance R King
Published online by Cambridge University Press:

01 August 2004, pp. 1042-1043
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons
Masami Terauchi
Published online by Cambridge University Press:

01 August 2004, pp. 1044-1045
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis
Heike Soltau, Peter Lechner, Gerhard Lutz, Lothar Strüder, Carlo Fiorini , Antonio Longoni, Rouven Eckhard, Andreas Pahlke, Martina Schnecke, Gerhard Schaller, Florian Schopper
Published online by Cambridge University Press:

01 August 2004, pp. 1046-1047
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications
Shaul Barkan, Valeri D Saveliev, Jan S Iwanczyk, Liangyuan Feng, Carolyn R Tull, Bradley E Patt, Dale E Newbury, John A Small
Published online by Cambridge University Press:

01 August 2004, pp. 1048-1049
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Methods and Examples of Quantitative Chemical Mapping using Synchrotron Soft X-ray Spectromicroscopy
Adam P Hitchcock, Cynthia Morin, Li Li, John Brash, Andreas Scholl, Andrew Doran
Published online by Cambridge University Press:

01 August 2004, pp. 1050-1051
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Environmental Scanning Electron Microscopy on Ultra-thin Films in 2-D and 3-D
R. Leblanc
Published online by Cambridge University Press:

01 August 2004, pp. 1052-1053
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In situ ESEM Study of Liquid Transport through Carbon Nanopipes
Maria Pia Rossi, Yury Gogotsi
Published online by Cambridge University Press:

01 August 2004, pp. 1054-1055
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-Situ Characterization of Micro and Nanoscale Kinetics by Variable Pressure Electron Microscopy I: Quantifying the Environment
Eric Doehne, Tiziana Lombardo
Published online by Cambridge University Press:

01 August 2004, pp. 1056-1057
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

A Two-Stage Gas Amplification Secondary Electron Detector for Ultra-High Resolution Imaging
B L Thiel, Milos Toth, R P M Schroemges, J J Scholtz, Gerard van Veen, W R Knowles
Published online by Cambridge University Press:

01 August 2004, pp. 1058-1059
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Design of a Two-Stage Gas Amplification Secondary Electron Detector for Imaging Insulating Samples at the sub-1 nm Scale
W. Ralph Knowles, B L Thiel, Milos Toth, R P M Schroemges, J J Scholtz, Gerard van Veen, Marcel Elders, A M Donald
Published online by Cambridge University Press:

01 August 2004, pp. 1060-1061
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Secondary Electron Imaging at Gas Pressures in Excess of 15 torr
Milos Toth, F S Baker
Published online by Cambridge University Press:

01 August 2004, pp. 1062-1063
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

In-situ Evaluation of Post Growth Treatments on the Cathodoluminescence Properties of Fluorescent Nano-particles in the Environmental Scanning Electron Microscope
M R Phillips, K E McBean
Published online by Cambridge University Press:

01 August 2004, pp. 1064-1065
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Dynamic Observations of Abnormal Grain-growth Occurring in Barium Titanate During Sintering
Srinivas Subramaniam, R D Roseman
Published online by Cambridge University Press:

01 August 2004, pp. 1066-1067
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Page 27 of 40

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

Trace Element Imaging and Analysis in Biological Cells with Scanning X-ray Fluorescence Microscopy

3D Elemental Mapping Using a Dedicated FIB/STEM System

X-Ray Spectromicroscopy Studies in Environmental Sciences

Simultaneous Amplitude and Phase Contrast Imaging with a Segmented Detector in Scanning Transmission X-ray Microscopy

3-D X-ray Microscopy using a Laboratory Source

Application of Full-Field X-ray Diffraction Microscopy in Biological and Material Science

Improvements of Elemental Mapping via X-ray Spectrum Imaging Combined with Principal Component Analysis and Zero-Peak Deconvolution

Peak Shifts in the NIST Microcalorimeter X-ray Detector

A High Energy-resolution Wavelength-dispersive Soft-X-ray Spectrometer for a Transmission Electron Microscope to Investigate Valence Electrons

Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis

A New Improved Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications

Methods and Examples of Quantitative Chemical Mapping using Synchrotron Soft X-ray Spectromicroscopy

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article

Environmental Scanning Electron Microscopy on Ultra-thin Films in 2-D and 3-D

In situ ESEM Study of Liquid Transport through Carbon Nanopipes

In-Situ Characterization of Micro and Nanoscale Kinetics by Variable Pressure Electron Microscopy I: Quantifying the Environment

A Two-Stage Gas Amplification Secondary Electron Detector for Ultra-High Resolution Imaging

Design of a Two-Stage Gas Amplification Secondary Electron Detector for Imaging Insulating Samples at the sub-1 nm Scale

Secondary Electron Imaging at Gas Pressures in Excess of 15 torr

In-situ Evaluation of Post Growth Treatments on the Cathodoluminescence Properties of Fluorescent Nano-particles in the Environmental Scanning Electron Microscope

Dynamic Observations of Abnormal Grain-growth Occurring in Barium Titanate During Sintering

Microscopy and Microanalysis

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Volume 10 - Issue S02 - August 2004

Micro X-ray Techniques: New Compositional and Structural Characterization Tools

Research Article

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Research Article